Identification and molecular mapping of a gene YrFL in wheat cultivar Flanders with durable resistance to stripe rust

• Published in: Plant disease
• Main Authors: Wu, Caijuan, Ma, Kangjie, Chen, Wenbin, Li, Jianhao, Liu, Mingjie, Cheng, Peng, Wang, Baotong, Li, Qiang
• Format: Journal Article
• Language: English
• Published: United States 01.09.2023
• Subjects: cultivar/resistance; Subject Areas; Disease management

Stripe rust, caused by Puccinia striiformis f. sp. tritici (Pst), is one of the most severe diseases of wheat (Triticum aestivum L.) worldwide. Identification and characterization of resistance genes is advantageous to cultivating wheat varieties with durable resistance, which is the most economic a...