Diode string with reduced clamping-voltage for ESD-protection of RF-circuits
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| Published in | Electronics letters Vol. 48; no. 6; pp. 317 - 318 |
|---|---|
| Main Authors | , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Stevenage
Institution of Engineering and Technology
15.03.2012
|
| Subjects | |
| Online Access | Get full text |
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| Author | LI, Z TORFS, G PIERCO, R YIN, X QIU, X. Z BAUWELINCK, J |
|---|---|
| Author_xml | – sequence: 1 givenname: R surname: PIERCO fullname: PIERCO, R organization: INTEC/ IMEC, Ghent University, Sint-Pietersnieuwstraat 41, 9000, Ghent, Belgium – sequence: 2 givenname: Z surname: LI fullname: LI, Z organization: INTEC/ IMEC, Ghent University, Sint-Pietersnieuwstraat 41, 9000, Ghent, Belgium – sequence: 3 givenname: G surname: TORFS fullname: TORFS, G organization: INTEC/ IMEC, Ghent University, Sint-Pietersnieuwstraat 41, 9000, Ghent, Belgium – sequence: 4 givenname: X surname: YIN fullname: YIN, X organization: INTEC/ IMEC, Ghent University, Sint-Pietersnieuwstraat 41, 9000, Ghent, Belgium – sequence: 5 givenname: J surname: BAUWELINCK fullname: BAUWELINCK, J organization: INTEC/ IMEC, Ghent University, Sint-Pietersnieuwstraat 41, 9000, Ghent, Belgium – sequence: 6 givenname: X. Z surname: QIU fullname: QIU, X. Z organization: INTEC/ IMEC, Ghent University, Sint-Pietersnieuwstraat 41, 9000, Ghent, Belgium |
| BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=25648218$$DView record in Pascal Francis |
| BookMark | eNo9kE1LAzEYhINUsK3e_AG5eDM1bzbJ7h6lHyoUBD_A25LNvlsj282SpEr_vS0VT8MMM3N4JmTU-x4JuQY-Ay7LO-xmgoOYcaHFGRlDpjgrAT5GZMw5ZExBKS_IJMavgxVlmY_JeuF8gzSm4PoN_XHpkwZsdhYbajuzHQ4p-_ZdMhukrQ90-bpgQ_AJbXK-p76lLytmXbA7l-IlOW9NF_HqT6fkfbV8mz-y9fPD0_x-zazQKjHLy5pjrSSva8VrsEJBrjXIupFSaWWaplAa21xBAVjkWuQlWs51JjNtLWRTcnv6tcHHGLCthuC2Juwr4NWRRIVddSRRHUkc6jen-mCiNV0bTG9d_N8IpWUhoMh-AdZ_Xuw |
| CODEN | ELLEAK |
| CitedBy_id | crossref_primary_10_1109_TDMR_2016_2616719 crossref_primary_10_1016_j_sse_2013_08_002 crossref_primary_10_1049_el_2013_3753 crossref_primary_10_1587_elex_16_20190306 crossref_primary_10_1007_s10854_013_1521_7 crossref_primary_10_1109_LED_2012_2233708 |
| Cites_doi | 10.1049/el:20010271 10.1049/el:20030221 10.1049/el.2009.0522 10.1049/el:20030597 10.1109/LED.2004.826531 10.1109/LED.2003.815938 |
| ContentType | Journal Article |
| Copyright | 2015 INIST-CNRS |
| Copyright_xml | – notice: 2015 INIST-CNRS |
| DBID | IQODW AAYXX CITATION |
| DOI | 10.1049/el.2012.0262 |
| DatabaseName | Pascal-Francis CrossRef |
| DatabaseTitle | CrossRef |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Applied Sciences Engineering |
| EISSN | 1350-911X |
| EndPage | 318 |
| ExternalDocumentID | 10_1049_el_2012_0262 25648218 |
| GroupedDBID | -4A -~X .DC 08R 0R~ 0ZK 1OC 24P 29G 2QL 3EH 4.4 4IJ 5GY 6IK 8FE 8FG 8VB 96U AAHHS AAHJG AAJGR ABJCF ABPTK ABQXS ACCFJ ACESK ACGFO ACGFS ACIWK ACXQS ADEYR ADIYS ADZOD AEEZP AEGXH AENEX AEQDE AFAZI AFKRA AI. AIAGR AIWBW AJBDE ALMA_UNASSIGNED_HOLDINGS ARAPS AVUZU BBWZM BENPR BGLVJ CCPQU CS3 DU5 EBS EJD ELQJU ESX F20 F5P F8P GOZPB GROUPED_DOAJ GRPMH HCIFZ HZ~ IAO IFBGX IFIPE IPLJI IQODW JAVBF K1G L6V LAI LGEZI LOTEE LXO LXU M43 M7S MCNEO MS~ NADUK NXXTH O9- OCL OK1 P0- P2P P62 PTHSS QWB R4Z RIE RIG RNS RUI TN5 U5U UNMZH VH1 WH7 XFK ZL0 ~ZZ AAYXX ALUQN CITATION ITC K7- |
| ID | FETCH-LOGICAL-c265t-c09b0eb540bb50b1c25176614bd44565add856ef75181e876279ec0063436cc13 |
| ISSN | 0013-5194 |
| IngestDate | Thu Sep 26 17:35:03 EDT 2024 Sun Oct 29 17:08:26 EDT 2023 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 6 |
| Keywords | BiCMOS technology Semiconductor alloys Low voltage Transmission line Diode Ge-Si alloys Spurious capacity Electrostatic discharge Protective device Protection circuit Multistage circuit |
| Language | English |
| License | CC BY 4.0 |
| LinkModel | OpenURL |
| MergedId | FETCHMERGED-LOGICAL-c265t-c09b0eb540bb50b1c25176614bd44565add856ef75181e876279ec0063436cc13 |
| PageCount | 2 |
| ParticipantIDs | crossref_primary_10_1049_el_2012_0262 pascalfrancis_primary_25648218 |
| PublicationCentury | 2000 |
| PublicationDate | 2012-03-15 |
| PublicationDateYYYYMMDD | 2012-03-15 |
| PublicationDate_xml | – month: 03 year: 2012 text: 2012-03-15 day: 15 |
| PublicationDecade | 2010 |
| PublicationPlace | Stevenage |
| PublicationPlace_xml | – name: Stevenage |
| PublicationTitle | Electronics letters |
| PublicationYear | 2012 |
| Publisher | Institution of Engineering and Technology |
| Publisher_xml | – name: Institution of Engineering and Technology |
| References | 10.1049/el.2012.0262_r7 10.1049/el.2012.0262_r6 10.1049/el.2012.0262_r5 10.1049/el.2012.0262_r4 10.1049/el.2012.0262_r3 10.1049/el.2012.0262_r2 10.1049/el.2012.0262_r1 |
| References_xml | – ident: 10.1049/el.2012.0262_r1 doi: 10.1049/el:20010271 – ident: 10.1049/el.2012.0262_r2 doi: 10.1049/el:20030221 – ident: 10.1049/el.2012.0262_r3 doi: 10.1049/el.2009.0522 – ident: 10.1049/el.2012.0262_r4 doi: 10.1049/el:20030597 – ident: 10.1049/el.2012.0262_r7 – ident: 10.1049/el.2012.0262_r5 doi: 10.1109/LED.2004.826531 – ident: 10.1049/el.2012.0262_r6 doi: 10.1109/LED.2003.815938 |
| SSID | ssj0012997 |
| Score | 2.1116061 |
| SourceID | crossref pascalfrancis |
| SourceType | Aggregation Database Index Database |
| StartPage | 317 |
| SubjectTerms | Applied sciences Diodes Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Exact sciences and technology Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
| Title | Diode string with reduced clamping-voltage for ESD-protection of RF-circuits |
| Volume | 48 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV07T8MwELagLCCEeIq3PMCEXJLYTtKRRwEhQKgUqbBEsetIlaoWhbDw67mLU5MCA7BEqVUnVb707vP57jtCDnzNJcqdstg3sEARcJbK2GeBn4GdVFlghbRv78KrR3Hdk73PLo5ldUmhmvr9x7qS_6AKY4ArVsn-AVl3URiAc8AXjoAwHH-F8flg3EeF2NxFVHNUYgUOqQForIRiYH0KTMvBbML2wzmrdBkqmti5YHqQ67eB1XNyIXrXG-f1aFjW-zjmfQ9uVJfh1U7TJfOUGQHP7nN3nNtkxEs39GSlCnrNepQB0zU4s3WWE8vpcwZsT9Qtp4hrb0jdDHJbj_nNPMNyBIHCLR-MwQaVIZ5Swf7inVzOYLlbLlqJGSY4O8HZs2QuiFpSNsjcafvuvuP2j8DJRpPeFfirq5IHmH9cv_sUGVl8SV_hf5HZhiY1ltFdJkvV8oCeWKxXyIwZrZKFmmjkGrkpUacWdYqo0wp1-hV1CqjTadTpOKM11NfJ40W7e3bFqp4YTAehLJj2WsozCni2UtJTvkbJOeRYqi-QnIO7imVoMtxN8w26uqhlNBJRwUOtfb5BGqPxyGwSGgrP8JRnwAi5SEOTpirLeD9KZdTXqfa2yOHk4SQvVvok-QmELbI_9eTcl4FNixgo5PYvL7RD5j9fvV3SKPI3sweUr1D7Fb4fnspUCA |
| link.rule.ids | 315,786,790,27955,27956 |
| linkProvider | ProQuest |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Diode+string+with+reduced+clamping-voltage+for+ESD-protection+of+RF-circuits&rft.jtitle=Electronics+letters&rft.au=Pierco%2C+R.&rft.au=Li%2C+Z.&rft.au=Torfs%2C+G.&rft.au=Yin%2C+X.&rft.date=2012-03-15&rft.issn=0013-5194&rft.volume=48&rft.issue=6&rft.spage=317&rft_id=info:doi/10.1049%2Fel.2012.0262&rft.externalDBID=n%2Fa&rft.externalDocID=10_1049_el_2012_0262 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0013-5194&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0013-5194&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0013-5194&client=summon |