APA (7th ed.) Citation

Jeong, Y., Jung, G., Park, K., Kim, Y., & Park, S. (2023). Empirical Analysis of Disaggregated Cloud Memory on Memory Intensive Applications. Journal of semiconductor technology and science, 23(5), 273-282. https://doi.org/10.5573/JSTS.2023.23.5.273

Chicago Style (17th ed.) Citation

Jeong, Yeonwoo, Gyeonghwan Jung, Kyuli Park, Youngjae Kim, and Sungyong Park. "Empirical Analysis of Disaggregated Cloud Memory on Memory Intensive Applications." Journal of Semiconductor Technology and Science 23, no. 5 (2023): 273-282. https://doi.org/10.5573/JSTS.2023.23.5.273.

MLA (9th ed.) Citation

Jeong, Yeonwoo, et al. "Empirical Analysis of Disaggregated Cloud Memory on Memory Intensive Applications." Journal of Semiconductor Technology and Science, vol. 23, no. 5, 2023, pp. 273-282, https://doi.org/10.5573/JSTS.2023.23.5.273.