Heat Conduction Characteristics of Vertically Aligned Single-Walled Carbon Nanotubes Measured by Raman Spectroscopy
In this work, the film thermal conductivity and the film-substrate interfacial thermal contact resistance of vertically-aligned single-walled carbon nanotube (VA-SWNT) films were measured with a proposed method utilizing temperature dependence of Raman spectrum. The proposed method harnesses the exc...
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| Published in | Nihon Kikai Gakkai rombunshuu. B hen Vol. 79; no. 798; pp. 185 - 198 |
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| Main Authors | , , , , , , , , |
| Format | Journal Article |
| Language | Japanese |
| Published |
The Japan Society of Mechanical Engineers
2013
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| Subjects | |
| Online Access | Get full text |
| ISSN | 0387-5016 1884-8346 |
| DOI | 10.1299/kikaib.79.185 |
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| Abstract | In this work, the film thermal conductivity and the film-substrate interfacial thermal contact resistance of vertically-aligned single-walled carbon nanotube (VA-SWNT) films were measured with a proposed method utilizing temperature dependence of Raman spectrum. The proposed method harnesses the excitation laser power of the Raman spectroscopy to heat the VA-SWNT films synthesized on a silicon substrate by alcohol catalytic chemical vapor decomposition (ACCVD) method, and measures film temperature from the Raman spectrum. A relationship between the input laser heat and the measured temperature is modeled with a detailed heat conduction equation, and its numerical solutions were compared with the experimentally measured results to extract the film thermal conductivity and the film-substrate interfacial thermal contact resistance. The method found the thermal conductivity of the VA-SWNT film to be around 2 Wm-1K-1 and the film-substrate interfacial thermal contact resistance to be around 2×10-6 m2KW-1. The obtained film thermal conductivity corresponds to the thermal conductivity equivalent of an individual SWNT of several tens of Wm-1K-1. This value was more than an order of magnitude smaller than the values reported on individual SWNTs. |
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| AbstractList | In this work, the film thermal conductivity and the film-substrate interfacial thermal contact resistance of vertically-aligned single-walled carbon nanotube (VA-SWNT) films were measured with a proposed method utilizing temperature dependence of Raman spectrum. The proposed method harnesses the excitation laser power of the Raman spectroscopy to heat the VA-SWNT films synthesized on a silicon substrate by alcohol catalytic chemical vapor decomposition (ACCVD) method, and measures film temperature from the Raman spectrum. A relationship between the input laser heat and the measured temperature is modeled with a detailed heat conduction equation, and its numerical solutions were compared with the experimentally measured results to extract the film thermal conductivity and the film-substrate interfacial thermal contact resistance. The method found the thermal conductivity of the VA-SWNT film to be around 2 Wm-1K-1 and the film-substrate interfacial thermal contact resistance to be around 2×10-6 m2KW-1. The obtained film thermal conductivity corresponds to the thermal conductivity equivalent of an individual SWNT of several tens of Wm-1K-1. This value was more than an order of magnitude smaller than the values reported on individual SWNTs. |
| Author | MARUYAMA, Shigeo BADAR, Saifullah THURAKITSEREE, Theerapol HORI, Takuma ISHIKAWA, Kei XIANG, Rong SHIOMI, Junichiro WATANABE, Makoto CHIASHI, Shohei |
| Author_xml | – sequence: 1 fullname: BADAR, Saifullah – sequence: 1 fullname: ISHIKAWA, Kei – sequence: 1 fullname: HORI, Takuma – sequence: 1 fullname: XIANG, Rong – sequence: 1 fullname: THURAKITSEREE, Theerapol – sequence: 1 fullname: CHIASHI, Shohei – sequence: 1 fullname: WATANABE, Makoto – sequence: 1 fullname: SHIOMI, Junichiro – sequence: 1 fullname: MARUYAMA, Shigeo organization: The Univ. of Tokyo, Dept. of Mechanical Engineering |
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| Title | Heat Conduction Characteristics of Vertically Aligned Single-Walled Carbon Nanotubes Measured by Raman Spectroscopy |
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