Microstructural evolution of metallorganic derived Pt-doped TiO2

A metalorganic precursor containing Ti and Pt was synthesized using Ti alkoxide derivative, amino acid, and platinum salt. The decomposition behavior of the precursor and thin-film formation were examined in terms of microstructure evolution and crystallization. The precursor yielded anatase at 400...

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Published inJournal of materials research Vol. 15; no. 12; pp. 2794 - 2799
Main Authors Hayakawa, Issei, Iwamoto, Yuji, Kikuta, Ko-ichi, Hirano, Shin-ichi
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.12.2000
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Abstract A metalorganic precursor containing Ti and Pt was synthesized using Ti alkoxide derivative, amino acid, and platinum salt. The decomposition behavior of the precursor and thin-film formation were examined in terms of microstructure evolution and crystallization. The precursor yielded anatase at 400 °C. Grain growth of platinum particles and TiO2 grains was suppressed even at 800 °C in the films. Suppression of grain growth was attributed to an effect of film thickness.
AbstractList A metalorganic precursor containing Ti and Pt was synthesized using Ti alkoxide derivative, amino acid, and platinum salt. The decomposition behavior of the precursor and thin-film formation were examined in terms of microstructure evolution and crystallization. The precursor yielded anatase at 400 °C. Grain growth of platinum particles and TiO2 grains was suppressed even at 800 °C in the films. Suppression of grain growth was attributed to an effect of film thickness.
A metallorganic precursor containing Ti and Pt was synthesised using Ti alkoxide derivative, amino acid and platinum salt. The decomposition behaviour of the precursor and thin-film formation were examined in terms of microstructural evolution and crystallisation. The precursor yielded anatase at 400 C. Grain growth of platinum particles and TiO2 grains was suppressed in the films, even at 800 C. Suppression of grain growth was attributed to the effect of film thickness. 13 refs.
Author Kikuta, Ko-ichi
Hayakawa, Issei
Hirano, Shin-ichi
Iwamoto, Yuji
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  givenname: Shin-ichi
  surname: Hirano
  fullname: Hirano, Shin-ichi
  organization: Graduate School of Engineering, Nagoya University, Nagoya 464–8603, Japan
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