Mutation Reduction Strategies Considered Harmful

Mutation analysis is a well known yet unfortunately costly method for measuring test suite quality. Researchers have proposed numerous mutation reduction strategies in order to reduce the high cost of mutation analysis, while preserving the representativeness of the original set of mutants. As mutat...

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Published inIEEE transactions on reliability Vol. 66; no. 3; pp. 854 - 874
Main Authors Gopinath, Rahul, Ahmed, Iftekhar, Alipour, Mohammad Amin, Jensen, Carlos, Groce, Alex
Format Journal Article
LanguageEnglish
Published IEEE 01.09.2017
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Abstract Mutation analysis is a well known yet unfortunately costly method for measuring test suite quality. Researchers have proposed numerous mutation reduction strategies in order to reduce the high cost of mutation analysis, while preserving the representativeness of the original set of mutants. As mutation reduction is an area of active research, it is important to understand the limits of possible improvements. We theoretically and empirically investigate the limits of improvement in effectiveness from using mutation reduction strategies compared to random sampling. Using real-world open source programs as subjects, we find an absolute limit in improvement of effectiveness over random sampling- 13.078%. Given our findings with respect to absolute limits, one may ask: How effective are the extant mutation reduction strategies? We evaluate the effectiveness of multiple mutation reduction strategies in comparison to random sampling. We find that none of the mutation reduction strategies evaluated-many forms of operator selection, and stratified sampling (on operators or program elements)-produced an effectiveness advantage larger than 5% in comparison with random sampling. Given the poor performance of mutation selection strategies-they may have a negligible advantage at best, and often perform worse than random sampling- we caution practicing testers against applying mutation reduction strategies without adequate justification.
AbstractList Mutation analysis is a well known yet unfortunately costly method for measuring test suite quality. Researchers have proposed numerous mutation reduction strategies in order to reduce the high cost of mutation analysis, while preserving the representativeness of the original set of mutants. As mutation reduction is an area of active research, it is important to understand the limits of possible improvements. We theoretically and empirically investigate the limits of improvement in effectiveness from using mutation reduction strategies compared to random sampling. Using real-world open source programs as subjects, we find an absolute limit in improvement of effectiveness over random sampling- 13.078%. Given our findings with respect to absolute limits, one may ask: How effective are the extant mutation reduction strategies? We evaluate the effectiveness of multiple mutation reduction strategies in comparison to random sampling. We find that none of the mutation reduction strategies evaluated-many forms of operator selection, and stratified sampling (on operators or program elements)-produced an effectiveness advantage larger than 5% in comparison with random sampling. Given the poor performance of mutation selection strategies-they may have a negligible advantage at best, and often perform worse than random sampling- we caution practicing testers against applying mutation reduction strategies without adequate justification.
Author Gopinath, Rahul
Jensen, Carlos
Ahmed, Iftekhar
Alipour, Mohammad Amin
Groce, Alex
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  organization: School of Informatics, Computing, and Cyber Systems (SICCS), Northern Arizona University, Flagstaff, AZ, USA
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Cites_doi 10.1109/C-M.1978.218136
10.1007/978-3-319-00945-2_11
10.1016/0164-1212(94)00098-0
10.1145/125489.125473
10.1109/ISSRE.2014.27
10.1145/1062455.1062530
10.1109/ICSE.1993.346062
10.1145/227607.227610
10.1145/2884781.2884787
10.1109/MUTATION.2006.7
10.1002/stvr.4370040104
10.1145/1572272.1572282
10.1002/(SICI)1099-1689(199912)9:4<205::AID-STVR186>3.0.CO;2-X
10.1109/TSE.2006.83
10.1109/CMPSAC.1991.170248
10.1109/SCAM.2008.36
10.1007/978-1-4757-5939-6_7
10.1109/ISSRE.2014.40
10.1145/75309.75324
10.1109/ICST.2012.162
10.1109/ICST.2014.12
10.1016/S0167-6423(03)00022-4
10.1016/j.infsof.2009.04.016
10.1109/ICST.2013.20
10.1145/2635868.2635929
10.1109/ICSTW.2016.45
10.1145/1806799.1806863
10.1145/1145735.1145737
10.1145/2635868.2635920
10.1109/ICST.2014.13
10.1007/978-1-4684-2001-2_9
10.1016/j.jss.2010.07.027
10.1145/285055.285059
10.1109/ICST.2016.22
10.1145/1566445.1566540
10.1007/978-3-642-34691-0_15
10.1145/2786805.2786858
10.1109/MS.2006.91
10.1287/moor.4.3.233
10.1145/2483760.2483774
10.1145/2568225.2568265
10.1002/stvr.226
10.1002/stvr.1486
10.1109/ICSTW.2014.20
10.1002/(SICI)1099-1689(200003)10:1<3::AID-STVR196>3.0.CO;2-P
10.1109/ICST.2011.32
10.1145/2591796.2591884
10.1109/ICST.2017.12
10.1145/567446.567468
10.1016/j.jss.2016.01.007
10.1007/978-3-319-15147-2_33
10.1109/ICSTW.2015.7107454
10.1109/ISSRE.2014.11
10.1109/ICSTW.2009.37
10.1145/1141911.1141916
10.1111/j.1751-5823.2002.tb00178.x
10.1109/ICSM.1999.792604
10.1109/ASE.2013.6693070
10.1017/CBO9780511809163
10.1109/TSE.2005.37
10.1145/1595696.1595750
10.1109/ICSE.2015.24
10.1109/TSE.2010.62
10.1145/229000.226313
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References ref57
ref13
ref56
ref15
coles (ref69) 2016
ref58
acree (ref11) 1980
ref14
ref53
lindstrm (ref30) 2016
ref52
ref55
ref10
ref17
ref19
gopinath (ref79) 2015
derezi?ska (ref16) 2013
rothermel (ref64) 1999
ji (ref18) 2009
ref46
ref45
ref48
ref85
coles (ref71) 0
ref44
ref43
ref49
ref8
ref7
ref9
wah (ref35) 2003; 48
strug (ref20) 2012
ref4
ref3
namin (ref54) 2008
ref6
ref5
ref82
ref81
ref40
ref84
ref83
offutt (ref42) 1996
ref80
ref78
ref34
ref36
(ref66) 0
wong (ref47) 1993
ref75
offutt (ref37) 1989; 14
ref77
ref33
ref76
ref32
ref2
ref39
ref38
myers (ref41) 1979
(ref74) 2016
mathur (ref50) 1993
budd (ref12) 1980
mathur (ref31) 2012
lindström (ref59) 2015
lipton (ref1) 1971
ref73
ref72
(ref67) 0
ref68
ref24
ref23
wong (ref51) 1994
ref26
ref25
ref22
hussain (ref63) 2008
ref65
ref21
ref28
ref27
ref29
ammann (ref70) 2015
ref60
ref62
ref61
References_xml – year: 2012
  ident: ref31
  publication-title: Foundations of Software Testing
– year: 0
  ident: ref66
  article-title: Software repository
– year: 1979
  ident: ref41
  publication-title: The Art of Software Testing
– ident: ref32
  doi: 10.1109/C-M.1978.218136
– start-page: 119
  year: 2013
  ident: ref16
  article-title: A quality estimation of mutation clustering in c# programs
  publication-title: New Results in Dependability and Computer Systems
  doi: 10.1007/978-3-319-00945-2_11
– ident: ref48
  doi: 10.1016/0164-1212(94)00098-0
– ident: ref38
  doi: 10.1145/125489.125473
– ident: ref29
  doi: 10.1109/ISSRE.2014.27
– ident: ref3
  doi: 10.1145/1062455.1062530
– ident: ref9
  doi: 10.1109/ICSE.1993.346062
– ident: ref76
  doi: 10.1145/227607.227610
– ident: ref28
  doi: 10.1145/2884781.2884787
– ident: ref53
  doi: 10.1109/MUTATION.2006.7
– ident: ref43
  doi: 10.1002/stvr.4370040104
– ident: ref77
  doi: 10.1145/1572272.1572282
– ident: ref49
  doi: 10.1002/(SICI)1099-1689(199912)9:4<205::AID-STVR186>3.0.CO;2-X
– start-page: 351
  year: 2008
  ident: ref54
  article-title: Sufficient mutation operators for measuring test effectiveness
  publication-title: Proc Int Conf Softw Eng
– ident: ref4
  doi: 10.1109/TSE.2006.83
– ident: ref46
  doi: 10.1109/CMPSAC.1991.170248
– ident: ref62
  doi: 10.1109/SCAM.2008.36
– start-page: 449
  year: 2015
  ident: ref70
  article-title: Transforming mutation testing from the technology of the future into the technology of the present
  publication-title: Proc IEEE Int?l Conf Software Testing Verification and Validation Workshops
– ident: ref8
  doi: 10.1007/978-1-4757-5939-6_7
– ident: ref40
  doi: 10.1109/ISSRE.2014.40
– volume: 14
  start-page: 131
  year: 1989
  ident: ref37
  article-title: The coupling effect: Fact or fiction?
  publication-title: ACM SIGSOFT Softw Eng Notes
  doi: 10.1145/75309.75324
– ident: ref21
  doi: 10.1109/ICST.2012.162
– ident: ref82
  doi: 10.1109/ICST.2014.12
– volume: 48
  start-page: 119
  year: 2003
  ident: ref35
  article-title: An analysis of the coupling effect I: Single test data
  publication-title: Sci Comput Program
  doi: 10.1016/S0167-6423(03)00022-4
– year: 2008
  ident: ref63
  article-title: Mutation clustering
– year: 1971
  ident: ref1
  article-title: Fault diagnosis of computer programs
– start-page: 320
  year: 1993
  ident: ref50
  article-title: Evaluation of the cost of alternate mutation strategies
  publication-title: Proc Brazilian Symp Software Eng
– year: 2015
  ident: ref79
  article-title: An empirical comparison of mutant selection approaches
– ident: ref61
  doi: 10.1016/j.infsof.2009.04.016
– year: 1996
  ident: ref42
  article-title: Subsumption of condition coverage techniques by mutation testing
– year: 2016
  ident: ref74
  article-title: What is the reverse of greedy algorithm for setcover?
  publication-title: Theoretical Computer Science Stack Exchange
– ident: ref56
  doi: 10.1109/ICST.2013.20
– year: 0
  ident: ref71
  article-title: Pit mutation testing: Mutators
– start-page: 422
  year: 2009
  ident: ref18
  article-title: A novel method of mutation clustering based on domain analysis
  publication-title: Proc Int Conf on Software Eng Knowledge Eng
– ident: ref5
  doi: 10.1145/2635868.2635929
– ident: ref57
  doi: 10.1109/ICSTW.2016.45
– year: 1980
  ident: ref12
  article-title: Mutation analysis of program test data
– start-page: 112
  year: 2016
  ident: ref30
  article-title: On strong mutation and subsuming mutants. IEEE workshop on mutation analysis (mutation 2016)
  publication-title: Proc Workshop on Mutation Analysis
– ident: ref13
  doi: 10.1145/1806799.1806863
– ident: ref84
  doi: 10.1145/1145735.1145737
– ident: ref68
  doi: 10.1145/2635868.2635920
– year: 2016
  ident: ref69
  article-title: Pit mutation testing
– ident: ref23
  doi: 10.1109/ICST.2014.13
– ident: ref72
  doi: 10.1007/978-1-4684-2001-2_9
– year: 1980
  ident: ref11
  article-title: On mutation
– ident: ref39
  doi: 10.1016/j.jss.2010.07.027
– ident: ref75
  doi: 10.1145/285055.285059
– ident: ref58
  doi: 10.1109/ICST.2016.22
– ident: ref55
  doi: 10.1145/1566445.1566540
– year: 1993
  ident: ref47
  article-title: On mutation and data flow
– start-page: 200
  year: 2012
  ident: ref20
  article-title: Machine learning approach in mutation testing
  publication-title: Testing Software and Systems
  doi: 10.1007/978-3-642-34691-0_15
– ident: ref26
  doi: 10.1145/2786805.2786858
– ident: ref7
  doi: 10.1109/MS.2006.91
– ident: ref73
  doi: 10.1287/moor.4.3.233
– ident: ref24
  doi: 10.1145/2483760.2483774
– ident: ref81
  doi: 10.1145/2568225.2568265
– ident: ref52
  doi: 10.1002/stvr.226
– ident: ref27
  doi: 10.1002/stvr.1486
– start-page: 439
  year: 1994
  ident: ref51
  article-title: Constrained mutation in C programs
  publication-title: Proc Brazilian Symp Software Eng
– ident: ref60
  doi: 10.1109/ICSTW.2014.20
– ident: ref34
  doi: 10.1002/(SICI)1099-1689(200003)10:1<3::AID-STVR196>3.0.CO;2-P
– year: 0
  ident: ref67
  article-title: Apache Maven project
– ident: ref25
  doi: 10.1109/ICST.2011.32
– ident: ref85
  doi: 10.1145/2591796.2591884
– ident: ref36
  doi: 10.1109/ICST.2017.12
– ident: ref33
  doi: 10.1145/567446.567468
– ident: ref17
  doi: 10.1016/j.jss.2016.01.007
– ident: ref15
  doi: 10.1007/978-3-319-15147-2_33
– ident: ref19
  doi: 10.1109/ICSTW.2015.7107454
– ident: ref6
  doi: 10.1109/ISSRE.2014.11
– ident: ref83
  doi: 10.1109/ICSTW.2009.37
– ident: ref80
  doi: 10.1145/1141911.1141916
– ident: ref78
  doi: 10.1111/j.1751-5823.2002.tb00178.x
– start-page: 179
  year: 1999
  ident: ref64
  article-title: Test case prioritization: An empirical study
  publication-title: Proc IEEE Int Conf Softw Maintenance
  doi: 10.1109/ICSM.1999.792604
– ident: ref14
  doi: 10.1109/ASE.2013.6693070
– ident: ref2
  doi: 10.1017/CBO9780511809163
– ident: ref22
  doi: 10.1109/TSE.2005.37
– ident: ref10
  doi: 10.1145/1595696.1595750
– ident: ref65
  doi: 10.1109/ICSE.2015.24
– ident: ref45
  doi: 10.1109/TSE.2010.62
– ident: ref44
  doi: 10.1145/229000.226313
– start-page: 112
  year: 2015
  ident: ref59
  article-title: On redundant mutants and strong mutation
  publication-title: International Conference on Software Testing Verification and Validation Workshops
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Snippet Mutation analysis is a well known yet unfortunately costly method for measuring test suite quality. Researchers have proposed numerous mutation reduction...
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SourceType Enrichment Source
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StartPage 854
SubjectTerms Computer bugs
Computer science
Indexes
Mutation analysis
Redundancy
Semantics
software testing
Upper bound
Title Mutation Reduction Strategies Considered Harmful
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