Conductivities and curing properties of electron-beam-irradiated anisotropic conductive films

Radiation-curable acrylated epoxy oligomer was irradiated by using an electron beam (E-beam) with dosages of 5, 10, 20, 40, 80, 200, 400, and 550 kGy to investigate the electrical and the physical properties of anisotropic conductive films (ACFs) and to evaluate the potential application of radiatio...

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Published inJournal of the Korean Physical Society Vol. 61; no. 2; pp. 282 - 285
Main Authors Shin, Tae Gyu, Lee, Inhyuk, Kim, Jae yong
Format Journal Article
LanguageEnglish
Published Seoul The Korean Physical Society 01.07.2012
한국물리학회
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Abstract Radiation-curable acrylated epoxy oligomer was irradiated by using an electron beam (E-beam) with dosages of 5, 10, 20, 40, 80, 200, 400, and 550 kGy to investigate the electrical and the physical properties of anisotropic conductive films (ACFs) and to evaluate the potential application of radiation technology to flip-chip package processing. An ACF is an insulating epoxy matrix containing conducting particles that keep the electrical conductivity along the out-of-plane direction and the insulation property along the in-plane direction. The contact resistance between ACF joints cured by using an E-beam irradiation of 80 kGy was measured under a constant bonding pressure of 2 kgf/cm 2 to demonstrate the effects of pad pitch size and the number of added conductive particles in the epoxy resin. Three types of PCBs, 1000-, 500-, and 100-µm pad pitches, were employed while the E-beam curable epoxy resin was mixed with conductive particles in a weight ratio of 10:1. The measured average contact resistance was 0.24 Ω with a minimum of 0.06 Ω for the samples prepared with a 100-µm pad pitch size, which is compatible with or lower than the values obtained from thermally-cured commercial ACFs. Our results demonstrate that an E-beam is an effective radiation method for curing epoxy resins at low temperatures in a short time and can be employed as a new technique for bonding circuits in high-density electric devices.
AbstractList Radiation-curable acrylated epoxy oligomer was irradiated by using an electron beam (E-beam) with dosages of 5, 10, 20, 40, 80, 200, 400, and 550 kGy to investigate the electrical and the physical properties of anisotropic conductive films (ACFs) and to evaluate the potential application of radiation technology to flip-chip package processing. An ACF is an insulating epoxy matrix containing conducting particles that keep the electrical conductivity along the out-of-plane direction and the insulation property along the in-plane direction. The contact resistance between ACF joints cured by using an E-beam irradiation of 80 kGy was measured under a constant bonding pressure of 2 kgf/cm 2 to demonstrate the effects of pad pitch size and the number of added conductive particles in the epoxy resin. Three types of PCBs, 1000-, 500-, and 100-µm pad pitches, were employed while the E-beam curable epoxy resin was mixed with conductive particles in a weight ratio of 10:1. The measured average contact resistance was 0.24 Ω with a minimum of 0.06 Ω for the samples prepared with a 100-µm pad pitch size, which is compatible with or lower than the values obtained from thermally-cured commercial ACFs. Our results demonstrate that an E-beam is an effective radiation method for curing epoxy resins at low temperatures in a short time and can be employed as a new technique for bonding circuits in high-density electric devices.
Radiation-curable acrylated epoxy oligomer was irradiated by using an electron beam (E-beam) with dosages of 5, 10, 20, 40, 80, 200, 400, and 550 kGy to investigate the electrical and the physical properties of anisotropic conductive films (ACFs) and to evaluate the potential application of radiation technology to flip-chip package processing. An ACF is an insulating epoxy matrix containing conducting particles that keep the electrical conductivity along the out-of-plane direction and the insulation property along the in-plane direction. The contact resistance between ACF joints cured by using an E-beam irradiation of 80 kGy was measured under a constant bonding pressure of 2 kgf/cm2 to demonstrate the effects of pad pitch size and the number of added conductive particles in the epoxy resin. Three types of PCBs, 1000-, 500-, and 100-탆 pad pitches, were employed while the E-beam curable epoxy resin was mixed with conductive particles in a weight ratio of 10:1. The measured average contact resistance was 0.24 ?with a minimum of 0.06 ?for the samples prepared with a 100-? pad pitch size, which is compatible with or lower than the values obtained from thermally-cured commercial ACFs. Our results demonstrate that an E-beam is an effective radiation method for curing epoxy resins at low temperatures in a short time and can be employed as a new technique for bonding circuits in high-density electric devices. KCI Citation Count: 0
Author Kim, Jae yong
Shin, Tae Gyu
Lee, Inhyuk
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Cites_doi 10.1016/j.radphyschem.2007.02.021
10.1016/j.radphyschem.2007.11.006
10.5012/jkcs.2003.47.3.250
10.3365/met.mat.2008.06.373
10.1007/s11664-006-0194-x
10.1016/j.compositesa.2008.12.010
10.1109/95.705468
10.1016/0969-806X(95)00424-V
10.1109/6040.763188
10.1016/S1359-835X(97)00076-6
10.1016/S0032-3861(01)00450-5
10.1016/S0026-2714(03)00185-9
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ACF
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References XiancongH.MeiwuS.GuotaiZ.HongZ.XiaopengH.ChunlanZ.Radiat. Phys. Chem.2008776432008RaPC...77..643X10.1016/j.radphyschem.2007.11.006
T. G. Shin et al., J. Nanosci. Nanotechnol., in preparation.
AlessiS.DispenzaC.FuochiP. G.CordaU.LavalleM.SpadaroG.Radiat. Phys. Chem.20077613082007RaPC...76.1308A10.1016/j.radphyschem.2007.02.021
SinghA.SaundersC.BernardJ. W.LopataV.KremersW.McDougallT. E.ChungM.TateshiM.Radiat. Phys. Chem.1996481531996RaPC...48..153S10.1016/0969-806X(95)00424-V
DicksonL. W.SinghA.Radiat. Phys. Chem.198831587
YimM.-J.PaikK.-W.IEEE Trans. Adv. Packag.19992216610.1109/6040.763188
KimJ.-W.LeeY.-C.JungS.-B.Met. Mater. Int.20081437310.3365/met.mat.2008.06.373
UddinM. A.AlamM. O.ChanY. C.ChanH. P.Microelectron. Reliab.20044450510.1016/S0026-2714(03)00185-9
HeS.ShiK.BaiJ.ZhangZ.LiL.DuZ.ZhangB.Polymer200142964110.1016/S0032-3861(01)00450-5
RaghavanJ.Composites Part A20094030010.1016/j.compositesa.2008.12.010
ParkS.-J.HeoG.-Y.LeeJ.-R.SuhD. H.J. Korean Chem. Soc.20034725010.5012/jkcs.2003.47.3.250
IslamR. A.ChanY. C.J. Electron. Mater.2006351232006JEMat..35..123I10.1007/s11664-006-0194-x
LimM.PaikK.IEEE Trans. Compon. Packag. Manuf. Technol. Part A19982122610.1109/95.705468
UddinM. A.ChanH. P.Rev. Adv. Mater. Sci.201127151
LeeS.ParkM.LimS.KimJ.J. Photopolym. Sci. Technol.20051648
GuastiF.RosiE.Composites Part A19972896510.1016/S1359-835X(97)00076-6
S. Lee (450_CR1) 2005; 16
S.-J. Park (450_CR9) 2003; 47
J.-W. Kim (450_CR14) 2008; 14
M. Lim (450_CR2) 1998; 21
J. Raghavan (450_CR8) 2009; 40
F. Guasti (450_CR4) 1997; 28
S. Alessi (450_CR6) 2007; 76
H. Xiancong (450_CR7) 2008; 77
450_CR11
M.-J. Yim (450_CR12) 1999; 22
S. He (450_CR10) 2001; 42
L. W. Dickson (450_CR3) 1988; 31
R. A. Islam (450_CR16) 2006; 35
A. Singh (450_CR5) 1996; 48
M. A. Uddin (450_CR13) 2011; 27
M. A. Uddin (450_CR15) 2004; 44
References_xml – ident: 450_CR11
– volume: 76
  start-page: 1308
  year: 2007
  ident: 450_CR6
  publication-title: Radiat. Phys. Chem.
  doi: 10.1016/j.radphyschem.2007.02.021
  contributor:
    fullname: S. Alessi
– volume: 77
  start-page: 643
  year: 2008
  ident: 450_CR7
  publication-title: Radiat. Phys. Chem.
  doi: 10.1016/j.radphyschem.2007.11.006
  contributor:
    fullname: H. Xiancong
– volume: 47
  start-page: 250
  year: 2003
  ident: 450_CR9
  publication-title: J. Korean Chem. Soc.
  doi: 10.5012/jkcs.2003.47.3.250
  contributor:
    fullname: S.-J. Park
– volume: 14
  start-page: 373
  year: 2008
  ident: 450_CR14
  publication-title: Met. Mater. Int.
  doi: 10.3365/met.mat.2008.06.373
  contributor:
    fullname: J.-W. Kim
– volume: 35
  start-page: 123
  year: 2006
  ident: 450_CR16
  publication-title: J. Electron. Mater.
  doi: 10.1007/s11664-006-0194-x
  contributor:
    fullname: R. A. Islam
– volume: 31
  start-page: 587
  year: 1988
  ident: 450_CR3
  publication-title: Radiat. Phys. Chem.
  contributor:
    fullname: L. W. Dickson
– volume: 40
  start-page: 300
  year: 2009
  ident: 450_CR8
  publication-title: Composites Part A
  doi: 10.1016/j.compositesa.2008.12.010
  contributor:
    fullname: J. Raghavan
– volume: 21
  start-page: 226
  year: 1998
  ident: 450_CR2
  publication-title: IEEE Trans. Compon. Packag. Manuf. Technol. Part A
  doi: 10.1109/95.705468
  contributor:
    fullname: M. Lim
– volume: 48
  start-page: 153
  year: 1996
  ident: 450_CR5
  publication-title: Radiat. Phys. Chem.
  doi: 10.1016/0969-806X(95)00424-V
  contributor:
    fullname: A. Singh
– volume: 16
  start-page: 48
  year: 2005
  ident: 450_CR1
  publication-title: J. Photopolym. Sci. Technol.
  contributor:
    fullname: S. Lee
– volume: 22
  start-page: 166
  year: 1999
  ident: 450_CR12
  publication-title: IEEE Trans. Adv. Packag.
  doi: 10.1109/6040.763188
  contributor:
    fullname: M.-J. Yim
– volume: 28
  start-page: 965
  year: 1997
  ident: 450_CR4
  publication-title: Composites Part A
  doi: 10.1016/S1359-835X(97)00076-6
  contributor:
    fullname: F. Guasti
– volume: 42
  start-page: 9641
  year: 2001
  ident: 450_CR10
  publication-title: Polymer
  doi: 10.1016/S0032-3861(01)00450-5
  contributor:
    fullname: S. He
– volume: 44
  start-page: 505
  year: 2004
  ident: 450_CR15
  publication-title: Microelectron. Reliab.
  doi: 10.1016/S0026-2714(03)00185-9
  contributor:
    fullname: M. A. Uddin
– volume: 27
  start-page: 151
  year: 2011
  ident: 450_CR13
  publication-title: Rev. Adv. Mater. Sci.
  contributor:
    fullname: M. A. Uddin
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Snippet Radiation-curable acrylated epoxy oligomer was irradiated by using an electron beam (E-beam) with dosages of 5, 10, 20, 40, 80, 200, 400, and 550 kGy to...
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Particle and Nuclear Physics
Physics
Physics and Astronomy
Theoretical
물리학
Title Conductivities and curing properties of electron-beam-irradiated anisotropic conductive films
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