APA (7th ed.) Citation

Ghosh, S., Koley, K., & Sarkar, C. K. (2016). Study of process induced variability of germanium-pTFET in analog and RF domain. Microelectronics and reliability, 65, 47-54. https://doi.org/10.1016/j.microrel.2016.07.149

Chicago Style (17th ed.) Citation

Ghosh, Sayani, Kalyan Koley, and Chandan K. Sarkar. "Study of Process Induced Variability of Germanium-pTFET in Analog and RF Domain." Microelectronics and Reliability 65 (2016): 47-54. https://doi.org/10.1016/j.microrel.2016.07.149.

MLA (9th ed.) Citation

Ghosh, Sayani, et al. "Study of Process Induced Variability of Germanium-pTFET in Analog and RF Domain." Microelectronics and Reliability, vol. 65, 2016, pp. 47-54, https://doi.org/10.1016/j.microrel.2016.07.149.