Analysis and testing for error tolerant motion estimation

We propose a novel system-level error tolerance approach specifically targeted for multimedia compression algorithms. In particular, we focus on the motion estimation process performed by most video encoders. While current manufacturing process classifies fabricated systems into two classes, namely,...

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Published in20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) pp. 514 - 522
Main Authors Hyukjune Chung, Ortega, A.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2005
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Abstract We propose a novel system-level error tolerance approach specifically targeted for multimedia compression algorithms. In particular, we focus on the motion estimation process performed by most video encoders. While current manufacturing process classifies fabricated systems into two classes, namely, perfect and imperfect, our proposed scheme employs categories which are based on acceptable/unacceptable performance degradation. By enabling the use of systems that would otherwise have been discarded we seek to increase the overall yield rate in the system fabrication process. To achieve this, we propose testing algorithms that aim at determining if faults in a given chip produce acceptable performance degradation, and we propose a technique which can cancel the effect of those among the acceptable faults that can be compensated.
AbstractList We propose a novel system-level error tolerance approach specifically targeted for multimedia compression algorithms. In particular, we focus on the motion estimation process performed by most video encoders. While current manufacturing process classifies fabricated systems into two classes, namely, perfect and imperfect, our proposed scheme employs categories which are based on acceptable/unacceptable performance degradation. By enabling the use of systems that would otherwise have been discarded we seek to increase the overall yield rate in the system fabrication process. To achieve this, we propose testing algorithms that aim at determining if faults in a given chip produce acceptable performance degradation, and we propose a technique which can cancel the effect of those among the acceptable faults that can be compensated.
Author Ortega, A.
Hyukjune Chung
Author_xml – sequence: 1
  surname: Hyukjune Chung
  fullname: Hyukjune Chung
  organization: Dept. of Electr. Eng.-Syst., Southern California Univ., Los Angeles, CA, USA
– sequence: 2
  givenname: A.
  surname: Ortega
  fullname: Ortega, A.
  organization: Dept. of Electr. Eng.-Syst., Southern California Univ., Los Angeles, CA, USA
BookMark eNotjT1PwzAYhC0oEklhZGLxH0h4_W2PVaGAVImBwlo58VsUlDrI9tJ_TypY7k6PTnc1WcQpIiF3DFrGwD08bnaf7y0HUC1zF6TiwpjGOK0vSQ1GO8WllnZBKqYUNMoYeU3qnL8BhJZGV8Stoh9PecjUx0AL5jLEL3qYEsWUZi3TiMnHQo9TGaZIz4WjP8cbcnXwY8bbf1-Sj83Tbv3SbN-eX9erbdNzZUvDOqeC8raXXhltdTBdAM4DgmUzBCtsQGFBIhfOGuFc30nmtQ0WNcNOLMn93-6AiPufNN-n054pKZVi4hdD7ElQ
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ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/DFTVS.2005.19
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library Online
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 2377-7966
EndPage 522
ExternalDocumentID 1544551
Genre orig-research
GroupedDBID 23M
29I
29O
6IE
6IF
6IH
6IK
6IL
AAJGR
ACGFS
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
CBEJK
CHZPO
IPLJI
JC5
M43
OCL
RIE
RIO
RNS
ID FETCH-LOGICAL-c258t-1b95d5a8c4a57686d7bd022de0818c40838de3804e23987399cb41a68d8e61eb3
IEDL.DBID RIE
ISBN 0769524648
9780769524641
ISSN 1550-5774
IngestDate Wed Jun 26 19:25:59 EDT 2024
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c258t-1b95d5a8c4a57686d7bd022de0818c40838de3804e23987399cb41a68d8e61eb3
OpenAccessLink http://sipi.usc.edu/%7Eortega/Papers/DFT05_hyukjune.pdf
PageCount 9
ParticipantIDs ieee_primary_1544551
PublicationCentury 2000
PublicationDate 20050000
PublicationDateYYYYMMDD 2005-01-01
PublicationDate_xml – year: 2005
  text: 20050000
PublicationDecade 2000
PublicationTitle 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)
PublicationTitleAbbrev DFTVS
PublicationYear 2005
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0036476
ssj0000451376
Score 1.8854319
Snippet We propose a novel system-level error tolerance approach specifically targeted for multimedia compression algorithms. In particular, we focus on the motion...
SourceID ieee
SourceType Publisher
StartPage 514
SubjectTerms Circuit faults
Circuit testing
Decoding
Degradation
Image coding
Image motion analysis
Motion estimation
Multimedia systems
Signal processing
Video compression
Title Analysis and testing for error tolerant motion estimation
URI https://ieeexplore.ieee.org/document/1544551
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjZ07T8MwFIWt0gkWHi3iLQ-MuG1iO7FnoKqQipBoUbfKjm8YQCmK0oVfj6_dlxADS5REGeJEyjn3xuczIbdcW8FLp5gsMZLjDS3zLgTYwICWxqjcDjCNPH7ORlPxNJOzFrnbZGEAIEw-gx7uhn_5blEssVXWD-QYzEvv5VrHrNamn4KcFI7SGr_CiEUPySLvwJn0HieW7FqmIhNqRd5ZHydb-Gb_YTh5e429FqTv7Cy5EhRneEjG63uNE00-esvG9orvXxjH_w7miHS32T76slGtY9KC6oQc7GAJO0SvSSXUVI42yOGo3ql3txTq2m-bxSd4iWtoXAKI4gUxAdkl0-Hj5H7EVksssCKVqmGJ1dJJowphsPDIXG6dV3UHSLorhPdnygFXAwHICcy9mymsSEymnIIs8YX4KWlXiwrOCJWJKrkohRJSizIrbebNnE0Tl3JuZWrOSQcfwvwrUjTmq_Ff_H36kuwHSGpodlyRdlMv4drLf2Nvwnv_AXb_pxA
link.rule.ids 310,311,783,787,792,793,799,4057,4058,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjZ27T8MwEMZPCAZg4dEi3nhgJG2T2K4zA1V5tEKiRd0qO74wgFJUpQt_PT67LyEGliiJPMRWlPvu4u93ANdpZnhaWBWJgiw5TtBGToVg1NKYCa1V27TIjdzry-6QP47EaANull4YRPSbz7BBp_5fvp3kMyqVNT05hvzSW05XKxncWsuKCpFSUgqu4TtMYHTvLXJjI-FUTkjaM5FwydWcvbO4jlf4zeZdZ_D2GqotxN9Za7riY05nD3qLpw1bTT4as8o08u9fIMf_Tmcf6it3H3tZxq0D2MDyEHbXwIQ1yBasEqZLyyoicZTvzOlbhtOpO1aTT3RBrmKhCRCjAcEDWYdh535w243mTRaiPBGqimKTCSu0yrmm1EPatrEurlsk1l3OnUJTFlPV4kikwLbTM7nhsZbKKpSxS8WPYLOclHgMTMSqSHnBFRcZL2RhpJNzJoltkqZGJPoEarQI46_A0RjP53_69-0r2O4Oes_j54f-0xnseGSqL32cw2Y1neGFEwOVufTvwA9srapb
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=20th+IEEE+International+Symposium+on+Defect+and+Fault+Tolerance+in+VLSI+Systems+%28DFT%2705%29&rft.atitle=Analysis+and+testing+for+error+tolerant+motion+estimation&rft.au=Hyukjune+Chung&rft.au=Ortega%2C+A.&rft.date=2005-01-01&rft.pub=IEEE&rft.isbn=9780769524641&rft.issn=1550-5774&rft.eissn=2377-7966&rft.spage=514&rft.epage=522&rft_id=info:doi/10.1109%2FDFTVS.2005.19&rft.externalDocID=1544551
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1550-5774&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1550-5774&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1550-5774&client=summon