Analysis and testing for error tolerant motion estimation
We propose a novel system-level error tolerance approach specifically targeted for multimedia compression algorithms. In particular, we focus on the motion estimation process performed by most video encoders. While current manufacturing process classifies fabricated systems into two classes, namely,...
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Published in | 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) pp. 514 - 522 |
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Main Authors | , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
2005
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Subjects | |
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Abstract | We propose a novel system-level error tolerance approach specifically targeted for multimedia compression algorithms. In particular, we focus on the motion estimation process performed by most video encoders. While current manufacturing process classifies fabricated systems into two classes, namely, perfect and imperfect, our proposed scheme employs categories which are based on acceptable/unacceptable performance degradation. By enabling the use of systems that would otherwise have been discarded we seek to increase the overall yield rate in the system fabrication process. To achieve this, we propose testing algorithms that aim at determining if faults in a given chip produce acceptable performance degradation, and we propose a technique which can cancel the effect of those among the acceptable faults that can be compensated. |
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AbstractList | We propose a novel system-level error tolerance approach specifically targeted for multimedia compression algorithms. In particular, we focus on the motion estimation process performed by most video encoders. While current manufacturing process classifies fabricated systems into two classes, namely, perfect and imperfect, our proposed scheme employs categories which are based on acceptable/unacceptable performance degradation. By enabling the use of systems that would otherwise have been discarded we seek to increase the overall yield rate in the system fabrication process. To achieve this, we propose testing algorithms that aim at determining if faults in a given chip produce acceptable performance degradation, and we propose a technique which can cancel the effect of those among the acceptable faults that can be compensated. |
Author | Ortega, A. Hyukjune Chung |
Author_xml | – sequence: 1 surname: Hyukjune Chung fullname: Hyukjune Chung organization: Dept. of Electr. Eng.-Syst., Southern California Univ., Los Angeles, CA, USA – sequence: 2 givenname: A. surname: Ortega fullname: Ortega, A. organization: Dept. of Electr. Eng.-Syst., Southern California Univ., Los Angeles, CA, USA |
BookMark | eNotjT1PwzAYhC0oEklhZGLxH0h4_W2PVaGAVImBwlo58VsUlDrI9tJ_TypY7k6PTnc1WcQpIiF3DFrGwD08bnaf7y0HUC1zF6TiwpjGOK0vSQ1GO8WllnZBKqYUNMoYeU3qnL8BhJZGV8Stoh9PecjUx0AL5jLEL3qYEsWUZi3TiMnHQo9TGaZIz4WjP8cbcnXwY8bbf1-Sj83Tbv3SbN-eX9erbdNzZUvDOqeC8raXXhltdTBdAM4DgmUzBCtsQGFBIhfOGuFc30nmtQ0WNcNOLMn93-6AiPufNN-n054pKZVi4hdD7ElQ |
CitedBy_id | crossref_primary_10_1049_iet_cds_2009_0353 crossref_primary_10_1109_TC_2010_239 crossref_primary_10_1109_TVLSI_2009_2020591 crossref_primary_10_1109_TMM_2012_2232649 crossref_primary_10_1109_TR_2009_2020845 crossref_primary_10_1109_TCAD_2011_2113690 crossref_primary_10_1109_TCSVT_2014_2321071 crossref_primary_10_1145_2071356_2071364 crossref_primary_10_1007_s10836_014_5488_y crossref_primary_10_1109_TR_2008_916875 crossref_primary_10_1007_s10836_013_5394_8 crossref_primary_10_1109_TC_2007_1017 crossref_primary_10_1007_s10836_013_5357_0 crossref_primary_10_1109_TCAD_2011_2179036 crossref_primary_10_1109_TCSVT_2016_2527303 crossref_primary_10_1109_TCAD_2009_2032375 crossref_primary_10_1109_TVLSI_2019_2945083 |
ContentType | Conference Proceeding |
DBID | 6IE 6IH CBEJK RIE RIO |
DOI | 10.1109/DFTVS.2005.19 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Electronic Library Online IEEE Proceedings Order Plans (POP) 1998-present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 2377-7966 |
EndPage | 522 |
ExternalDocumentID | 1544551 |
Genre | orig-research |
GroupedDBID | 23M 29I 29O 6IE 6IF 6IH 6IK 6IL AAJGR ACGFS ADZIZ ALMA_UNASSIGNED_HOLDINGS CBEJK CHZPO IPLJI JC5 M43 OCL RIE RIO RNS |
ID | FETCH-LOGICAL-c258t-1b95d5a8c4a57686d7bd022de0818c40838de3804e23987399cb41a68d8e61eb3 |
IEDL.DBID | RIE |
ISBN | 0769524648 9780769524641 |
ISSN | 1550-5774 |
IngestDate | Wed Jun 26 19:25:59 EDT 2024 |
IsDoiOpenAccess | false |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | true |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c258t-1b95d5a8c4a57686d7bd022de0818c40838de3804e23987399cb41a68d8e61eb3 |
OpenAccessLink | http://sipi.usc.edu/%7Eortega/Papers/DFT05_hyukjune.pdf |
PageCount | 9 |
ParticipantIDs | ieee_primary_1544551 |
PublicationCentury | 2000 |
PublicationDate | 20050000 |
PublicationDateYYYYMMDD | 2005-01-01 |
PublicationDate_xml | – year: 2005 text: 20050000 |
PublicationDecade | 2000 |
PublicationTitle | 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) |
PublicationTitleAbbrev | DFTVS |
PublicationYear | 2005 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0036476 ssj0000451376 |
Score | 1.8854319 |
Snippet | We propose a novel system-level error tolerance approach specifically targeted for multimedia compression algorithms. In particular, we focus on the motion... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 514 |
SubjectTerms | Circuit faults Circuit testing Decoding Degradation Image coding Image motion analysis Motion estimation Multimedia systems Signal processing Video compression |
Title | Analysis and testing for error tolerant motion estimation |
URI | https://ieeexplore.ieee.org/document/1544551 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjZ07T8MwFIWt0gkWHi3iLQ-MuG1iO7FnoKqQipBoUbfKjm8YQCmK0oVfj6_dlxADS5REGeJEyjn3xuczIbdcW8FLp5gsMZLjDS3zLgTYwICWxqjcDjCNPH7ORlPxNJOzFrnbZGEAIEw-gx7uhn_5blEssVXWD-QYzEvv5VrHrNamn4KcFI7SGr_CiEUPySLvwJn0HieW7FqmIhNqRd5ZHydb-Gb_YTh5e429FqTv7Cy5EhRneEjG63uNE00-esvG9orvXxjH_w7miHS32T76slGtY9KC6oQc7GAJO0SvSSXUVI42yOGo3ql3txTq2m-bxSd4iWtoXAKI4gUxAdkl0-Hj5H7EVksssCKVqmGJ1dJJowphsPDIXG6dV3UHSLorhPdnygFXAwHICcy9mymsSEymnIIs8YX4KWlXiwrOCJWJKrkohRJSizIrbebNnE0Tl3JuZWrOSQcfwvwrUjTmq_Ff_H36kuwHSGpodlyRdlMv4drLf2Nvwnv_AXb_pxA |
link.rule.ids | 310,311,783,787,792,793,799,4057,4058,27937,55086 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjZ27T8MwEMZPCAZg4dEi3nhgJG2T2K4zA1V5tEKiRd0qO74wgFJUpQt_PT67LyEGliiJPMRWlPvu4u93ANdpZnhaWBWJgiw5TtBGToVg1NKYCa1V27TIjdzry-6QP47EaANull4YRPSbz7BBp_5fvp3kMyqVNT05hvzSW05XKxncWsuKCpFSUgqu4TtMYHTvLXJjI-FUTkjaM5FwydWcvbO4jlf4zeZdZ_D2GqotxN9Za7riY05nD3qLpw1bTT4as8o08u9fIMf_Tmcf6it3H3tZxq0D2MDyEHbXwIQ1yBasEqZLyyoicZTvzOlbhtOpO1aTT3RBrmKhCRCjAcEDWYdh535w243mTRaiPBGqimKTCSu0yrmm1EPatrEurlsk1l3OnUJTFlPV4kikwLbTM7nhsZbKKpSxS8WPYLOclHgMTMSqSHnBFRcZL2RhpJNzJoltkqZGJPoEarQI46_A0RjP53_69-0r2O4Oes_j54f-0xnseGSqL32cw2Y1neGFEwOVufTvwA9srapb |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=20th+IEEE+International+Symposium+on+Defect+and+Fault+Tolerance+in+VLSI+Systems+%28DFT%2705%29&rft.atitle=Analysis+and+testing+for+error+tolerant+motion+estimation&rft.au=Hyukjune+Chung&rft.au=Ortega%2C+A.&rft.date=2005-01-01&rft.pub=IEEE&rft.isbn=9780769524641&rft.issn=1550-5774&rft.eissn=2377-7966&rft.spage=514&rft.epage=522&rft_id=info:doi/10.1109%2FDFTVS.2005.19&rft.externalDocID=1544551 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1550-5774&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1550-5774&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1550-5774&client=summon |