A rapid technique for assessing the moisture ingress susceptibility of plastic-encapsulated integrated circuits - Chwastek, E. J.; Shaw, R. N. (Quality and reliability engineering international, 1987)
Keywords: Applied sciences; Electronics; Exact sciences and technology; IC reliability; Microelectronic fabrication (materials and surfaces technology); Plastic encapsulated integrated circuits; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Processing control; Encapsulation; Lifetime; Integrated circuit; Package; Plastics; Moisture test