Use of atomic force microscopy to image surfaces during fluid flow

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Published inJournal of the Electrochemical Society Vol. 141; no. 7; pp. L85 - L87
Main Authors SCHMIDT, W. U, ALKIRE, R. C
Format Journal Article
LanguageEnglish
Published Pennington, NJ Electrochemical Society 01.07.1994
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Author SCHMIDT, W. U
ALKIRE, R. C
Author_xml – sequence: 1
  givenname: W. U
  surname: SCHMIDT
  fullname: SCHMIDT, W. U
  organization: Univ. Illinois Urbana-Champaign, dep. chemical eng., materials res. lab., Urbana IL 61801, United States
– sequence: 2
  givenname: R. C
  surname: ALKIRE
  fullname: ALKIRE, R. C
  organization: Univ. Illinois Urbana-Champaign, dep. chemical eng., materials res. lab., Urbana IL 61801, United States
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=4251768$$DView record in Pascal Francis
BookMark eNo9T8tqwzAQFCWFOmkP_QMdeunBqVZvH9vQFwR6ac5GllfBxbGMlFDy93VI6GVnB2aGmTmZDXFAQu6BLQFk9QRLzpRiUl-RAiqpSgMAM1IwBqKUWsENmef8M1Gw0hTkZZORxkDdPu46T0NMHun0pZh9HI90H2m3c1uk-ZCC85hpe0jdsKWhP3TtdOPvLbkOrs94d8EF2by9fq8-yvXX--fqeV16rvS-NFZbo4UViI3AYBveSIbCWeWENgxV4Fy41qDBprLcOBC2kpV0WhltLYgFeTznnsrlhKEe09QtHWtg9Wl8DfVl_KR9OGtHl73rQ3KD7_K_QXIFU6j4A9-KWP0
CODEN JESOAN
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ContentType Journal Article
Copyright 1994 INIST-CNRS
Copyright_xml – notice: 1994 INIST-CNRS
DBID IQODW
AAYXX
CITATION
DOI 10.1149/1.2055046
DatabaseName Pascal-Francis
CrossRef
DatabaseTitle CrossRef
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Chemistry
EISSN 1945-7111
EndPage L87
ExternalDocumentID 10_1149_1_2055046
4251768
GroupedDBID -~X
.-4
.DC
08R
29L
41~
5GY
6TJ
9M8
AATNI
ABDNZ
ABEFU
ABTAH
ACBEA
ACHIP
ACYGS
ADNWM
AENEX
AI.
AKPSB
ALMA_UNASSIGNED_HOLDINGS
CJUJL
CS3
DU5
EBS
EJD
F20
F5P
H13
H~9
IOP
IQODW
JGOPE
KOT
MV1
MVM
N5L
NFQFE
NHB
REC
RHI
RNS
RPA
TAE
TN5
UPT
VH1
VOH
VQP
WH7
XFK
XJT
XOL
YQT
YXB
ZY4
~02
0R~
AAYXX
ABJNI
AOAED
CITATION
ROL
ID FETCH-LOGICAL-c256t-786876383eeb3ef8b2b40e3a85a3670e5f223ad7e7eb9827a1389494a65768813
ISSN 0013-4651
IngestDate Fri Aug 23 02:26:27 EDT 2024
Sun Oct 29 17:07:50 EDT 2023
IsPeerReviewed true
IsScholarly true
Issue 7
Keywords Atomic force microscopy
Reynolds number
Transition metal
Crystal face
Electroplating
Experimental study
Sulfuric acid
Electrodes
Flow(fluid)
Platinum
Imaging
Copper
Electrochemical reaction
Language English
License CC BY 4.0
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-c256t-786876383eeb3ef8b2b40e3a85a3670e5f223ad7e7eb9827a1389494a65768813
ParticipantIDs crossref_primary_10_1149_1_2055046
pascalfrancis_primary_4251768
PublicationCentury 1900
PublicationDate 1994-07-01
PublicationDateYYYYMMDD 1994-07-01
PublicationDate_xml – month: 07
  year: 1994
  text: 1994-07-01
  day: 01
PublicationDecade 1990
PublicationPlace Pennington, NJ
PublicationPlace_xml – name: Pennington, NJ
PublicationTitle Journal of the Electrochemical Society
PublicationYear 1994
Publisher Electrochemical Society
Publisher_xml – name: Electrochemical Society
SSID ssj0011847
Score 1.5528322
SourceID crossref
pascalfrancis
SourceType Aggregation Database
Index Database
StartPage L85
SubjectTerms Chemistry
Electrochemistry
Electrodeposition
Exact sciences and technology
General and physical chemistry
Study of interfaces
Title Use of atomic force microscopy to image surfaces during fluid flow
Volume 141
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1bS8MwFA46H1REvOKdIL5J5rqmbfqoc7LpvCAb-DaaNQFBN9EOwV_vOUnazfvlJYxuLDTn68l30nO-Q8ie1kFVaukxEaeccb9SYYnwFJOc615FyUDZLN-LsNHhpzfBzUiewFSXZLLce_m0ruQ_VoVrYFeskv2DZYs_hQvwGewLI1gYxl_ZuGMP4iFuxgx3oJ_wkN5jhh3WmhhaeXuPOTlPw0dtUq9cUaK-G96mMA6ev-CmyEbrtkFOL1cUcPmdxZFMrXHePG6bHL3yfqcATuuseW0yLK_L7gQ2dUV2vMg_dQdd30zg_KjnM-yibncR6zpjHrAod525b7WqVg5E0ZinbNlOPW7Tbdld96M_5yiHinE8RFL8E83sd3tZkWHIUYotFJNkqgoeCF1f8_KqeL0EYW2Ut7bA23CSUzDbQTHXG6Iy95A8wUpo2-xkjIG0F8i8Mw89tDhYJBOqv0Sma3nHviUyOyYuuUyOAB10oKlFBzXooCN00GxADTpojg5q0UENOiiiY4V0TurtWoO5jhmsB9Q1Y5EIUWFQ-EpJX2khq5JXlJ-IIEGhPhVoYINJGqlIyVhUowRfU_OYJyGGncLzV0mpP-irNUIlmDOCZZLAojgH1uKF-Fx7Xoq8Tql1spsvT_fBCqN0bZF73PW6bg3XyfabhSt-6cyz8cP3m2RmBM8tUsoeh2obSGAmd4xBXwFGmVw1
link.rule.ids 315,783,787,27936,27937
linkProvider IOP Publishing
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Use+of+atomic+force+microscopy+to+image+surfaces+during+fluid+flow&rft.jtitle=Journal+of+the+Electrochemical+Society&rft.au=SCHMIDT%2C+W.+U&rft.au=ALKIRE%2C+R.+C&rft.date=1994-07-01&rft.pub=Electrochemical+Society&rft.issn=0013-4651&rft.eissn=1945-7111&rft.volume=141&rft.issue=7&rft.spage=L85&rft.epage=L87&rft_id=info:doi/10.1149%2F1.2055046&rft.externalDBID=n%2Fa&rft.externalDocID=4251768
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0013-4651&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0013-4651&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0013-4651&client=summon