Use of atomic force microscopy to image surfaces during fluid flow
Saved in:
Published in | Journal of the Electrochemical Society Vol. 141; no. 7; pp. L85 - L87 |
---|---|
Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Pennington, NJ
Electrochemical Society
01.07.1994
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Author | SCHMIDT, W. U ALKIRE, R. C |
---|---|
Author_xml | – sequence: 1 givenname: W. U surname: SCHMIDT fullname: SCHMIDT, W. U organization: Univ. Illinois Urbana-Champaign, dep. chemical eng., materials res. lab., Urbana IL 61801, United States – sequence: 2 givenname: R. C surname: ALKIRE fullname: ALKIRE, R. C organization: Univ. Illinois Urbana-Champaign, dep. chemical eng., materials res. lab., Urbana IL 61801, United States |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=4251768$$DView record in Pascal Francis |
BookMark | eNo9T8tqwzAQFCWFOmkP_QMdeunBqVZvH9vQFwR6ac5GllfBxbGMlFDy93VI6GVnB2aGmTmZDXFAQu6BLQFk9QRLzpRiUl-RAiqpSgMAM1IwBqKUWsENmef8M1Gw0hTkZZORxkDdPu46T0NMHun0pZh9HI90H2m3c1uk-ZCC85hpe0jdsKWhP3TtdOPvLbkOrs94d8EF2by9fq8-yvXX--fqeV16rvS-NFZbo4UViI3AYBveSIbCWeWENgxV4Fy41qDBprLcOBC2kpV0WhltLYgFeTznnsrlhKEe09QtHWtg9Wl8DfVl_KR9OGtHl73rQ3KD7_K_QXIFU6j4A9-KWP0 |
CODEN | JESOAN |
CitedBy_id | crossref_primary_10_1021_jp961583v crossref_primary_10_1063_1_1511806 crossref_primary_10_1039_PC9959200023 crossref_primary_10_1070_RC1995v064n08ABEH000174 crossref_primary_10_1524_zpch_1999_208_Part_1_2_107 crossref_primary_10_1016_S0013_4686_96_00433_1 crossref_primary_10_1016_S0039_6028_96_01395_7 crossref_primary_10_1016_S0009_2509_05_80007_7 crossref_primary_10_1524_zpch_1997_1_1_107 crossref_primary_10_1021_acs_cgd_8b00508 crossref_primary_10_1063_1_1148498 crossref_primary_10_1021_cr960067y |
ContentType | Journal Article |
Copyright | 1994 INIST-CNRS |
Copyright_xml | – notice: 1994 INIST-CNRS |
DBID | IQODW AAYXX CITATION |
DOI | 10.1149/1.2055046 |
DatabaseName | Pascal-Francis CrossRef |
DatabaseTitle | CrossRef |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Chemistry |
EISSN | 1945-7111 |
EndPage | L87 |
ExternalDocumentID | 10_1149_1_2055046 4251768 |
GroupedDBID | -~X .-4 .DC 08R 29L 41~ 5GY 6TJ 9M8 AATNI ABDNZ ABEFU ABTAH ACBEA ACHIP ACYGS ADNWM AENEX AI. AKPSB ALMA_UNASSIGNED_HOLDINGS CJUJL CS3 DU5 EBS EJD F20 F5P H13 H~9 IOP IQODW JGOPE KOT MV1 MVM N5L NFQFE NHB REC RHI RNS RPA TAE TN5 UPT VH1 VOH VQP WH7 XFK XJT XOL YQT YXB ZY4 ~02 0R~ AAYXX ABJNI AOAED CITATION ROL |
ID | FETCH-LOGICAL-c256t-786876383eeb3ef8b2b40e3a85a3670e5f223ad7e7eb9827a1389494a65768813 |
ISSN | 0013-4651 |
IngestDate | Fri Aug 23 02:26:27 EDT 2024 Sun Oct 29 17:07:50 EDT 2023 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 7 |
Keywords | Atomic force microscopy Reynolds number Transition metal Crystal face Electroplating Experimental study Sulfuric acid Electrodes Flow(fluid) Platinum Imaging Copper Electrochemical reaction |
Language | English |
License | CC BY 4.0 |
LinkModel | OpenURL |
MergedId | FETCHMERGED-LOGICAL-c256t-786876383eeb3ef8b2b40e3a85a3670e5f223ad7e7eb9827a1389494a65768813 |
ParticipantIDs | crossref_primary_10_1149_1_2055046 pascalfrancis_primary_4251768 |
PublicationCentury | 1900 |
PublicationDate | 1994-07-01 |
PublicationDateYYYYMMDD | 1994-07-01 |
PublicationDate_xml | – month: 07 year: 1994 text: 1994-07-01 day: 01 |
PublicationDecade | 1990 |
PublicationPlace | Pennington, NJ |
PublicationPlace_xml | – name: Pennington, NJ |
PublicationTitle | Journal of the Electrochemical Society |
PublicationYear | 1994 |
Publisher | Electrochemical Society |
Publisher_xml | – name: Electrochemical Society |
SSID | ssj0011847 |
Score | 1.5528322 |
SourceID | crossref pascalfrancis |
SourceType | Aggregation Database Index Database |
StartPage | L85 |
SubjectTerms | Chemistry Electrochemistry Electrodeposition Exact sciences and technology General and physical chemistry Study of interfaces |
Title | Use of atomic force microscopy to image surfaces during fluid flow |
Volume | 141 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1bS8MwFA46H1REvOKdIL5J5rqmbfqoc7LpvCAb-DaaNQFBN9EOwV_vOUnazfvlJYxuLDTn68l30nO-Q8ie1kFVaukxEaeccb9SYYnwFJOc615FyUDZLN-LsNHhpzfBzUiewFSXZLLce_m0ruQ_VoVrYFeskv2DZYs_hQvwGewLI1gYxl_ZuGMP4iFuxgx3oJ_wkN5jhh3WmhhaeXuPOTlPw0dtUq9cUaK-G96mMA6ev-CmyEbrtkFOL1cUcPmdxZFMrXHePG6bHL3yfqcATuuseW0yLK_L7gQ2dUV2vMg_dQdd30zg_KjnM-yibncR6zpjHrAod525b7WqVg5E0ZinbNlOPW7Tbdld96M_5yiHinE8RFL8E83sd3tZkWHIUYotFJNkqgoeCF1f8_KqeL0EYW2Ut7bA23CSUzDbQTHXG6Iy95A8wUpo2-xkjIG0F8i8Mw89tDhYJBOqv0Sma3nHviUyOyYuuUyOAB10oKlFBzXooCN00GxADTpojg5q0UENOiiiY4V0TurtWoO5jhmsB9Q1Y5EIUWFQ-EpJX2khq5JXlJ-IIEGhPhVoYINJGqlIyVhUowRfU_OYJyGGncLzV0mpP-irNUIlmDOCZZLAojgH1uKF-Fx7Xoq8Tql1spsvT_fBCqN0bZF73PW6bg3XyfabhSt-6cyz8cP3m2RmBM8tUsoeh2obSGAmd4xBXwFGmVw1 |
link.rule.ids | 315,783,787,27936,27937 |
linkProvider | IOP Publishing |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Use+of+atomic+force+microscopy+to+image+surfaces+during+fluid+flow&rft.jtitle=Journal+of+the+Electrochemical+Society&rft.au=SCHMIDT%2C+W.+U&rft.au=ALKIRE%2C+R.+C&rft.date=1994-07-01&rft.pub=Electrochemical+Society&rft.issn=0013-4651&rft.eissn=1945-7111&rft.volume=141&rft.issue=7&rft.spage=L85&rft.epage=L87&rft_id=info:doi/10.1149%2F1.2055046&rft.externalDBID=n%2Fa&rft.externalDocID=4251768 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0013-4651&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0013-4651&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0013-4651&client=summon |