Application of relative configurational entropy as a measure of spatial inhomogeneity to Co/C film evolving along the temperature - Garncarek, Z.; Majcherczyk, T.; Potoczna-Petru, D.; Piasecki, R. (Journal of materials science letters, 2000)
Keywords: Applied sciences; Composition and phase identification; Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Metals. Metallurgy; Physics; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Temperature dependence; Configuration; Measuring methods; Entropy; Experimental study; Carbon; Cobalt; Heat treatments; Substrates; Metallic thin films; Spatial distribution; Transition elements; Nonmetals; Inhomogeneity; TEM