Long-term stability of scientific X-ray CMOS detectors

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 1072; p. 170146
• Main Authors: Liu, Mingjun, Wu, Qinyu, Ling, Zhixing, Zhang, Chen, Yuan, Weimin, Zhang, Shuang-Nan
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.03.2025
• Subjects: Aging; CMOS; Reliability; X-ray detector; Aging; CMOS; X-ray detector; Reliability

In recent years, complementary metal–oxide–semiconductor (CMOS) sensors have been demonstrated to have significant potential in X-ray astronomy, where long-term reliability is crucial for space X-ray telescopes. This study examines the long-term stability of a scientific CMOS sensor, focusing on its...