XPS investigations of the interactions of hydrogen with thin films of zirconium oxide I. Hydrogen treatments on a 10 Å thick film

• Published in: Applied surface science Vol. 89; no. 3; pp. 255 - 261
• Main Authors: Wong, P.C., Li, Y.S., Zhou, M.Y., Mitchell, K.A.R.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 1995; Elsevier Science
• Subjects: Adsorbed layers and thin films; Chemistry; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Diffusion; interface formation; Electron and ion emission by liquids and solids; impact phenomena; Exact sciences and technology; General and physical chemistry; Photoemission and photoelectron spectra; Physics; Solid surfaces and solid-solid interfaces; Solid-gas interface; Surface physical chemistry; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Surface reaction; Heat treatment; Zirconium oxide; Solid solid interface; Transition element compounds; Photoelectron spectrometry; X ray; Experimental study; Hydrogenation; Inorganic compound; Thin film

Interactions of hydrogen with the interface formed between ZrO 2 and zirconium suboxide (ZrO x , x < 2) were studied on a 10 Å zirconium oxide film prepared on gold foil for X-ray photoelectron spectroscopy (XPS) analysis. This film was subject to a set of sequential treatments. Reaction with H 2...