Counterfactual Inference for Generalized Zero-Shot Compound-Fault Diagnosis

• Published in: IEEE transactions on instrumentation and measurement Vol. 74; pp. 1 - 11
• Main Authors: Xu, Juan, Kong, Hui, Ding, Xu, Yuan, Xiaohui
• Format: Journal Article
• Language: English
• Published: New York IEEE 2025; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Accuracy; Compounds; Counterfactual inference; Data models; Fault diagnosis; Faults; generalized zero-shot learning (GZSL); generative adversarial network; Generative adversarial networks; Inference; Neural networks; Predictive models; rolling bearing; Semantics; Training; Zero shot learning
• DOI: 10.1109/TIM.2025.3565070
• ISSN: 0018-9456

Learning a model heavily depends on the training examples, which are sometimes difficult to obtain if not impossible. This a typically true for fault diagnosis in machinery, particularly for compound faults. The counterfactual inference reveals the causal components inherent in the fault data in an interpretable manner, divulging critical causes from the observable phenomena. This article proposes a method to address the imbalance and interpretability issues of generalized zero-shot learning (GZSL) methods for compound-fault diagnosis using counterfactual inference. Our method uses a structural causal model (SCM) to decouple and generate fault features, which enhances the capabilities of the variational autoencoder and generative adversarial network (VAE-GAN) through a strengthened discriminator, and reveals the intrinsic causal components in fault data, distinguishing key fault causes from accompanying phenomena. This enables the classification of both single and compound faults by learning from examples of single faults, easing the dependence on the examples of compound faults. Extensive experimental results show that our method, trained solely with single-fault samples, achieves a harmonic average of 87.40% accuracy for both single and compound faults, outperforming existing state-of-the-art methods. This significantly improves both the accuracy and interpretability of compound-fault diagnosis.