Industrial Anomaly Detection System: A Multicase Algorithm Leveraging Feature Information and Memory Bank - Shi, Yunhan; Gao, Bin; Yang, Geng; Li, Haoran; Lok Woo, Wai (IEEE transactions on instrumentation and measurement, 2025)
Keywords: Ablation; Algorithms; Anomalies; Anomaly detection; Anomaly detection (AD); Clustering algorithms; defect localization and segmentation; Extraterrestrial measurements; Feature extraction; Input variables; Learning; Measurement; metric learning; Modules; multicase generalization; nondestructive testing; Overfitting; Testing; Training; Vectors