APA (7th ed.) Citation

Shi, Y., Gao, B., Yang, G., Li, H., & Lok Woo, W. (2025). Industrial Anomaly Detection System: A Multicase Algorithm Leveraging Feature Information and Memory Bank. IEEE transactions on instrumentation and measurement, 74, 1-9. https://doi.org/10.1109/TIM.2025.3551852

Chicago Style (17th ed.) Citation

Shi, Yunhan, Bin Gao, Geng Yang, Haoran Li, and Wai Lok Woo. "Industrial Anomaly Detection System: A Multicase Algorithm Leveraging Feature Information and Memory Bank." IEEE Transactions on Instrumentation and Measurement 74 (2025): 1-9. https://doi.org/10.1109/TIM.2025.3551852.

MLA (9th ed.) Citation

Shi, Yunhan, et al. "Industrial Anomaly Detection System: A Multicase Algorithm Leveraging Feature Information and Memory Bank." IEEE Transactions on Instrumentation and Measurement, vol. 74, 2025, pp. 1-9, https://doi.org/10.1109/TIM.2025.3551852.