Ni, F., Dai, Y., Shen, B., & Xu, J. (2024). Structural Safety Analysis of Electromagnetic Levitation System Subject to Track Irregularities. IEEE transactions on applied superconductivity, 34(8), 1-5. https://doi.org/10.1109/TASC.2024.3434825
Chicago Style (17th ed.) CitationNi, Fei, Yawen Dai, Boyang Shen, and Junqi Xu. "Structural Safety Analysis of Electromagnetic Levitation System Subject to Track Irregularities." IEEE Transactions on Applied Superconductivity 34, no. 8 (2024): 1-5. https://doi.org/10.1109/TASC.2024.3434825.
MLA (9th ed.) CitationNi, Fei, et al. "Structural Safety Analysis of Electromagnetic Levitation System Subject to Track Irregularities." IEEE Transactions on Applied Superconductivity, vol. 34, no. 8, 2024, pp. 1-5, https://doi.org/10.1109/TASC.2024.3434825.