APA (7th ed.) Citation

Guo, Z., Jiang, J., Chen, D., Fang, J., Yang, J., Han, J., . . . Zeng, X. (2025). EF-CIM: An Endurance Friendly CIM Accelerator Using Embedded NVM With Bit-Aware Wear Leveling for Efficient Light-Weight On-Chip Training in Edge Devices. IEEE transactions on circuits and systems. I, Regular papers, 72(9), 4697-4709. https://doi.org/10.1109/TCSI.2024.3491736

Chicago Style (17th ed.) Citation

Guo, Zhiwang, Jingwen Jiang, Deyang Chen, Jinbei Fang, Jianguo Yang, Jun Han, Xiaoyong Xue, and Xiaoyang Zeng. "EF-CIM: An Endurance Friendly CIM Accelerator Using Embedded NVM With Bit-Aware Wear Leveling for Efficient Light-Weight On-Chip Training in Edge Devices." IEEE Transactions on Circuits and Systems. I, Regular Papers 72, no. 9 (2025): 4697-4709. https://doi.org/10.1109/TCSI.2024.3491736.

MLA (9th ed.) Citation

Guo, Zhiwang, et al. "EF-CIM: An Endurance Friendly CIM Accelerator Using Embedded NVM With Bit-Aware Wear Leveling for Efficient Light-Weight On-Chip Training in Edge Devices." IEEE Transactions on Circuits and Systems. I, Regular Papers, vol. 72, no. 9, 2025, pp. 4697-4709, https://doi.org/10.1109/TCSI.2024.3491736.