Cao, S., Sun, X., Liu, W., Wu, D., Zhang, J., Li, Y., . . . Gao, L. (2024). EXVul: Toward Effective and Explainable Vulnerability Detection for IoT Devices. IEEE internet of things journal, 11(12), 22385-22398. https://doi.org/10.1109/JIOT.2024.3381641
Chicago Style (17th ed.) CitationCao, Sicong, Xiaobing Sun, Wei Liu, Di Wu, Jiale Zhang, Yan Li, Tom H. Luan, and Longxiang Gao. "EXVul: Toward Effective and Explainable Vulnerability Detection for IoT Devices." IEEE Internet of Things Journal 11, no. 12 (2024): 22385-22398. https://doi.org/10.1109/JIOT.2024.3381641.
MLA (9th ed.) CitationCao, Sicong, et al. "EXVul: Toward Effective and Explainable Vulnerability Detection for IoT Devices." IEEE Internet of Things Journal, vol. 11, no. 12, 2024, pp. 22385-22398, https://doi.org/10.1109/JIOT.2024.3381641.