Low temperature crystallization behavior of multi-walled carbon nanotubes/Pb(Zr0.52Ti0.48)O3 nanocomposite thin films through annealing in various atmosphere and duration control
We report a successful fabrication of 300 nm thick carbon nanotubes and Pb(Zr0.52Ti0.48)O3 (CNT–PZT) nanocomposite thin films with annealing temperature as low as 500 °C in H2/N2 atmosphere. Realizing the thickness of CNT–PZT nanocomposite thin films down to few hundred nanometers is one way to redu...
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Published in | Current applied physics Vol. 14; no. 9; pp. 1304 - 1311 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
01.09.2014
한국물리학회 |
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ISSN | 1567-1739 1878-1675 |
DOI | 10.1016/j.cap.2014.07.004 |
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Abstract | We report a successful fabrication of 300 nm thick carbon nanotubes and Pb(Zr0.52Ti0.48)O3 (CNT–PZT) nanocomposite thin films with annealing temperature as low as 500 °C in H2/N2 atmosphere. Realizing the thickness of CNT–PZT nanocomposite thin films down to few hundred nanometers is one way to reduce the operating voltage of its application to micro- or nano-electromechanical system. The field emission scanning electron microscopic and atomic microscopic analysis revealed that the nanocomposite thin films annealed in H2/N2 atmosphere exhibits the most favorable surface morphology with adequate perovskite (111) reflection of PZT based on X-ray diffraction analysis. The measured dielectric constant and loss tangent of the nanocomposite thin films show that the annealing duration of 30 min promotes the optimum dielectric properties of the nanocomposite thin films. Our observations suggest that the annealing atmosphere and duration are important parameters in controlling the crystallization behavior hence the dielectric properties of the nanocomposite thin films, which can be readily applicable to other nanocomposite thin films.
•Multi-walled carbon nanotubes/Pb(Zr0.52Ti0.48)O3 nanocomposite thin films were grown using sol–gel method.•The annealing atmosphere and duration was found to be important parameters in controlling the crystallization behavior.•Morphology, crystal structure and dielectric properties were studied upon annealing atmosphere and duration.•Nucleation behaviors of PZT crystal on the defects of multi-walled carbon nanotubes were reported. |
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AbstractList | We report a successful fabrication of 300 nm thick carbon nanotubes and Pb(Zr0.52Ti0.48)O3 (CNTePZT) nanocomposite thin films with annealing temperature as low as 500 C in H2/N2 atmosphere. Realizing the thickness of CNTePZT nanocomposite thin films down to few hundred nanometers is one way to reduce the operating voltage of its application to micro- or nano-electromechanical system. The field emission scanning electron microscopic and atomic microscopic analysis revealed that the nanocomposite thin films annealed in H2/N2 atmosphere exhibits the most favorable surface morphology with adequate perovskite (111) reflection of PZT based on X-ray diffraction analysis. The measured dielectric constant and loss tangent of the nanocomposite thin films show that the annealing duration of 30 min promotes the optimum dielectric properties of the nanocomposite thin films. Our observations suggest that the annealing atmosphere and duration are important parameters in controlling the crystallization behavior hence the dielectric properties of the nanocomposite thin films, which can be readily applicable to other nanocomposite thin films. KCI Citation Count: 5 We report a successful fabrication of 300 nm thick carbon nanotubes and Pb(Zr0.52Ti0.48)O3 (CNT–PZT) nanocomposite thin films with annealing temperature as low as 500 °C in H2/N2 atmosphere. Realizing the thickness of CNT–PZT nanocomposite thin films down to few hundred nanometers is one way to reduce the operating voltage of its application to micro- or nano-electromechanical system. The field emission scanning electron microscopic and atomic microscopic analysis revealed that the nanocomposite thin films annealed in H2/N2 atmosphere exhibits the most favorable surface morphology with adequate perovskite (111) reflection of PZT based on X-ray diffraction analysis. The measured dielectric constant and loss tangent of the nanocomposite thin films show that the annealing duration of 30 min promotes the optimum dielectric properties of the nanocomposite thin films. Our observations suggest that the annealing atmosphere and duration are important parameters in controlling the crystallization behavior hence the dielectric properties of the nanocomposite thin films, which can be readily applicable to other nanocomposite thin films. •Multi-walled carbon nanotubes/Pb(Zr0.52Ti0.48)O3 nanocomposite thin films were grown using sol–gel method.•The annealing atmosphere and duration was found to be important parameters in controlling the crystallization behavior.•Morphology, crystal structure and dielectric properties were studied upon annealing atmosphere and duration.•Nucleation behaviors of PZT crystal on the defects of multi-walled carbon nanotubes were reported. |
Author | Han, Jin Kyu Kim, Jong Ok Bu, Sang Don Kwak, Jin Ho |
Author_xml | – sequence: 1 givenname: Jin Kyu surname: Han fullname: Han, Jin Kyu – sequence: 2 givenname: Jin Ho surname: Kwak fullname: Kwak, Jin Ho – sequence: 3 givenname: Jong Ok surname: Kim fullname: Kim, Jong Ok – sequence: 4 givenname: Sang Don surname: Bu fullname: Bu, Sang Don email: sbu@chonbuk.ac.kr, sbu@jbnu.ac.kr |
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CitedBy_id | crossref_primary_10_1016_j_cap_2016_01_009 crossref_primary_10_1039_D1TA10854A crossref_primary_10_3938_jkps_72_800 crossref_primary_10_1080_14328917_2017_1304858 crossref_primary_10_1021_acsami_7b14262 crossref_primary_10_3938_jkps_72_1209 crossref_primary_10_1038_srep29562 |
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SubjectTerms | Carbon nanotubes Nanocomposites Oxides Pb(Zr0.52Ti0.48)O3 Sol–gel methods 물리학 |
Title | Low temperature crystallization behavior of multi-walled carbon nanotubes/Pb(Zr0.52Ti0.48)O3 nanocomposite thin films through annealing in various atmosphere and duration control |
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