A Robust Method With Adaptive Inpainting for Edge Detection of Single Silicon Crystal

• Published in: IEEE sensors journal Vol. 23; no. 5; pp. 4500 - 4507
• Main Authors: Zhang, Xinyu, Liu, Ding, Lin, Pengyi, Ji, Ruirui
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.03.2023; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Crystal growth; Crystals; curvature driven diffusions; Diameters; Differential equations; Differential operators; Edge detection; edge inpainting; fractional differential operators; Image edge detection; Integrity; Maintenance engineering; Operators (mathematics); Silicon; Single silicon crystal growth; Temperature measurement

The improvement of the edge detection accuracy and integrity of the single silicon crystal and bright halo is the key to measuring the crystal diameter. This paper proposes an edge detection method with adaptive image inpainting. Firstly, according to the image characteristics, an evaluation functio...