Power-Line-Triggered ESD Protection SCR for 0-20 GHz Applications in CMOS Technology - Chang, Chun-Rong; Lin, Chun-Yu (IEEE transactions on electron devices, 2023)
Keywords: Broadband; Circuit design; Circuit protection; Clamps; CMOS; CMOS process; Discharges (electric); electrostatic discharge (ESD); Electrostatic discharge protection; Electrostatic discharges; High speed; Inductors; Parasitic capacitance; Power lines; Robustness; Silicon controlled rectifiers; silicon-controlled rectifier (SCR)