APA (7th ed.) Citation

Chang, C., & Lin, C. (2023). Power-Line-Triggered ESD Protection SCR for 0-20 GHz Applications in CMOS Technology. IEEE transactions on electron devices, 70(12), 6103-6109. https://doi.org/10.1109/TED.2023.3320985

Chicago Style (17th ed.) Citation

Chang, Chun-Rong, and Chun-Yu Lin. "Power-Line-Triggered ESD Protection SCR for 0-20 GHz Applications in CMOS Technology." IEEE Transactions on Electron Devices 70, no. 12 (2023): 6103-6109. https://doi.org/10.1109/TED.2023.3320985.

MLA (9th ed.) Citation

Chang, Chun-Rong, and Chun-Yu Lin. "Power-Line-Triggered ESD Protection SCR for 0-20 GHz Applications in CMOS Technology." IEEE Transactions on Electron Devices, vol. 70, no. 12, 2023, pp. 6103-6109, https://doi.org/10.1109/TED.2023.3320985.