Why smart metrology is no longer optional

• Published in: IEEE instrumentation & measurement magazine Vol. 23; no. 2; pp. 82 - 86
• Main Authors: Pou, Jean-Michel, Leblond, Laurent
• Format: Magazine Article
• Language: English
• Published: New York IEEE 01.04.2020; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Algorithms; Artificial intelligence; Big Data; Measurement uncertainty; Measuring instruments; Metrology; Reliability; Standardization; Uncertainty

Smart Metrology is the subject of a work we wrote and published with the Association Française de Normalisation (AFNOR, French Standardization Association) in 2016 [1]. In this new work, we offer a very different vision of the role of metrology in industry from the traditional view, which tends to f...