Why smart metrology is no longer optional

Smart Metrology is the subject of a work we wrote and published with the Association Française de Normalisation (AFNOR, French Standardization Association) in 2016 [1]. In this new work, we offer a very different vision of the role of metrology in industry from the traditional view, which tends to f...

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Published inIEEE instrumentation & measurement magazine Vol. 23; no. 2; pp. 82 - 86
Main Authors Pou, Jean-Michel, Leblond, Laurent
Format Magazine Article
LanguageEnglish
Published New York IEEE 01.04.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text
ISSN1094-6969
1941-0123
DOI10.1109/MIM.2020.9062693

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Abstract Smart Metrology is the subject of a work we wrote and published with the Association Française de Normalisation (AFNOR, French Standardization Association) in 2016 [1]. In this new work, we offer a very different vision of the role of metrology in industry from the traditional view, which tends to focus on the management of a stock of measuring instruments. The emergence of Big Data and Artificial Intelligence algorithms has caused us to rethink the role of the metrologist: while the job of auditors has more or less been to stick approval labels on instruments. Big Data, by definition, requires reliable data to produce meaningful results. This article sets out to explain why the metrology we are familiar with has been acceptable until now, and why it has become so important to change our approach so as to concentrate on improving performance and managing resources more efficiently. This article is the translation of the article "Pourquoi la Smart Metrology n'est plus une option" that has been published, in French, in the blog www.smart-metrology.com [2].
AbstractList Smart Metrology is the subject of a work we wrote and published with the Association Française de Normalisation (AFNOR, French Standardization Association) in 2016 [1]. In this new work, we offer a very different vision of the role of metrology in industry from the traditional view, which tends to focus on the management of a stock of measuring instruments. The emergence of Big Data and Artificial Intelligence algorithms has caused us to rethink the role of the metrologist: while the job of auditors has more or less been to stick approval labels on instruments. Big Data, by definition, requires reliable data to produce meaningful results. This article sets out to explain why the metrology we are familiar with has been acceptable until now, and why it has become so important to change our approach so as to concentrate on improving performance and managing resources more efficiently. This article is the translation of the article "Pourquoi la Smart Metrology n'est plus une option" that has been published, in French, in the blog www.smart-metrology.com [2].
Author Pou, Jean-Michel
Leblond, Laurent
Author_xml – sequence: 1
  givenname: Jean-Michel
  surname: Pou
  fullname: Pou, Jean-Michel
– sequence: 2
  givenname: Laurent
  surname: Leblond
  fullname: Leblond, Laurent
BookMark eNo9kE1Lw0AQhhepYFu9C14Cnjyk7sdkNnuU4kehxYvicUmXSU1Js3E3PeTfm5LqaQbmeYeZZ8YmjW-IsVvBF0Jw87hZbRaSS74wHCUadcGmwoBIuZBqMvTcQIoGzRWbxbjnXADofMoevr77JB6K0CUH6oKv_a5Pqpg0Pql9s6OQ-LarfFPU1-yyLOpIN-c6Z58vzx_Lt3T9_rpaPq1TJwG6FEvQJgMC1CJTTitTqAwdGZBckCNVakngQOM2J9KEW0OoESl3oJC0mrP7cW8b_M-RYmf3_hiGA6KVKjcKpYJsoPhIueBjDFTaNlTDG70V3J6E2EGIPQmxZyFD5G6MVET0j_9NfwGAblvf
CODEN IIMMF9
ContentType Magazine Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020
DBID 97E
RIA
RIE
AAYXX
CITATION
7SC
7SP
7U5
8FD
F28
FR3
JQ2
L7M
L~C
L~D
DOI 10.1109/MIM.2020.9062693
DatabaseName IEEE Xplore (IEEE)
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
DatabaseTitle CrossRef
Technology Research Database
Computer and Information Systems Abstracts – Academic
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Solid State and Superconductivity Abstracts
Engineering Research Database
Advanced Technologies Database with Aerospace
ANTE: Abstracts in New Technology & Engineering
Computer and Information Systems Abstracts Professional
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1941-0123
EndPage 86
ExternalDocumentID 10_1109_MIM_2020_9062693
9062693
Genre orig-research
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
85S
97E
AAJGR
AARMG
AASAJ
AAWTH
AAYJJ
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
AENEX
AETIX
AFOGA
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
AZLTO
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
TN5
VH1
VJK
AAYOK
AAYXX
CITATION
RIG
7SC
7SP
7U5
8FD
F28
FR3
JQ2
L7M
L~C
L~D
ID FETCH-LOGICAL-c244t-6f47954e467153c739a356ce94201ece3f72e4c476b8ee7e6b9e6766e8c436e73
IEDL.DBID RIE
ISSN 1094-6969
IngestDate Mon Jun 30 06:18:06 EDT 2025
Tue Jul 01 04:12:23 EDT 2025
Wed Aug 27 02:35:21 EDT 2025
IsPeerReviewed false
IsScholarly false
Issue 2
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
https://doi.org/10.15223/policy-029
https://doi.org/10.15223/policy-037
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c244t-6f47954e467153c739a356ce94201ece3f72e4c476b8ee7e6b9e6766e8c436e73
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
PQID 2389362345
PQPubID 85415
PageCount 5
ParticipantIDs proquest_journals_2389362345
crossref_primary_10_1109_MIM_2020_9062693
ieee_primary_9062693
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2020-04-01
PublicationDateYYYYMMDD 2020-04-01
PublicationDate_xml – month: 04
  year: 2020
  text: 2020-04-01
  day: 01
PublicationDecade 2020
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE instrumentation & measurement magazine
PublicationTitleAbbrev IM-M
PublicationYear 2020
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References pou (ref8) 0
(ref4) 0
(ref3) 2017
(ref7) 0
pou (ref2) 0
(ref6) 0
pou (ref5) 0
pou (ref1) 2016
References_xml – year: 0
  ident: ref2
  publication-title: Why Smart Metrology is No Longer an Option
– year: 2016
  ident: ref1
  publication-title: Smart Metrology From the metrology of instrumentation to the metrology of decisions (De la métrologie des instruments à la métrologie des décisions)
– year: 0
  ident: ref8
  publication-title: Bayes or an Exciting Way to (Re)consider the Measures
– year: 0
  ident: ref7
– year: 2017
  ident: ref3
– year: 0
  ident: ref5
  publication-title: A New Intelligence is Born
– year: 0
  ident: ref4
  publication-title: Goal Smart Tolerancing
– year: 0
  ident: ref6
  publication-title: Guide 98-4 A Copernican revolution for metrology (Checks Tests Measurements N°64 - September2018 can be downloaded from link
SSID ssj0014478
Score 1.2082452
Snippet Smart Metrology is the subject of a work we wrote and published with the Association Française de Normalisation (AFNOR, French Standardization Association) in...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Index Database
Publisher
StartPage 82
SubjectTerms Algorithms
Artificial intelligence
Big Data
Measurement uncertainty
Measuring instruments
Metrology
Reliability
Standardization
Uncertainty
Title Why smart metrology is no longer optional
URI https://ieeexplore.ieee.org/document/9062693
https://www.proquest.com/docview/2389362345
Volume 23
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEB7agqCXaqtYrZKDl4Jp02Szmz2KWKoQTxZ7C5vNREWbFJMe6q93Ny98HbyFkA3LzOw8v5kFuOBWJMLIk2YkHGES6U1Nj4bSjNEWyvwwEru639m_p_MFuVu6yxZcNr0wiFiAz3CsH4tafpTKjU6VTfRMXcqdNrRV4Fb2ajUVA0JY2fbGiUk55XVJ0uIT_9ZXgaBtjav130xQcafKL0VcWJdZF_x6XyWo5HW8ycOx_PgxsvG_G9-Hbj022rgqBeMAWpj0YO_L9MEe7BToT5n1YfT4vDWylZIiY4UauZ4-bY2XzEhS4y3VaT8jXZc5w0NYzG4erudmdYeCKZXhzk0aE8ZdgkofKt0mmcOF41KJnCjLjxKdmNlIJGE09BAZ0pAjZZSiJ4lDkTlH0EnSBI_BEIJGTJFWRLFFppJ6TuTaQvlPKqLkDHEAo5qswboclREUIYbFA8WCQLMgqCgxgL6mUvNd83pY8yGozlIW2NqnUl4acU_-XnUKu_rfJZ5mCJ38fYNnylXIw_NCRj4BkdS5Zw
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT8JAEJ4gxqgXFDSiqD14IbFQ2u1u92iMBJRygsit2W6napSWCBzw17vbUuLr4K1puu1mZjrvbxbgiluRCCNPmpFwhEmk1zE9GkozRlso88NI7Gq8sz-kvTG5n7iTElxvsDCImDWfYUtfZrX8KJVLnSpr65m6lDtbsO1qMG6O1trUDAhhOfCNE5NyyouipMXbft9XoaBttdZv-GaEslNVfqnizL50K-AXO8vbSl5by0XYkh8_hjb-d-sHUCkGRxs3uWgcQgmTKux_mT9YhZ2s_1POa9B8fF4Z86mSI2OKunc9fVoZL3MjSY23VCf-jHSWZw2PYNy9G932zPUpCqZUpnth0pgw7hJUGlFpN8kcLhyXSuRE2X6U6MTMRiIJo6GHyJCGHCmjFD1JHIrMOYZykiZ4AoYQNGKKtCKKLdKR1HMi1xbKg1IxJWeIdWgWZA1m-bCMIAsyLB4oFgSaBcGaEnWoaSptntvcbhR8CNZ_0zywtVel_DTinv696hJ2eyN_EAz6w4cz2NPfybtrGlBevC_xXDkOi_Aik5dPb3e8rw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Why+smart+metrology+is+no+longer+optional&rft.jtitle=IEEE+instrumentation+%26+measurement+magazine&rft.au=Pou%2C+Jean-Michel&rft.au=Leblond%2C+Laurent&rft.date=2020-04-01&rft.issn=1094-6969&rft.eissn=1941-0123&rft.volume=23&rft.issue=2&rft.spage=82&rft.epage=86&rft_id=info:doi/10.1109%2FMIM.2020.9062693&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_MIM_2020_9062693
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1094-6969&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1094-6969&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1094-6969&client=summon