APA (7th ed.) Citation

Pou, J., & Leblond, L. (2020). Why smart metrology is no longer optional. IEEE instrumentation & measurement magazine, 23(2), 82-86. https://doi.org/10.1109/MIM.2020.9062693

Chicago Style (17th ed.) Citation

Pou, Jean-Michel, and Laurent Leblond. "Why Smart Metrology Is No Longer Optional." IEEE Instrumentation & Measurement Magazine 23, no. 2 (2020): 82-86. https://doi.org/10.1109/MIM.2020.9062693.

MLA (9th ed.) Citation

Pou, Jean-Michel, and Laurent Leblond. "Why Smart Metrology Is No Longer Optional." IEEE Instrumentation & Measurement Magazine, vol. 23, no. 2, 2020, pp. 82-86, https://doi.org/10.1109/MIM.2020.9062693.