APA (7th ed.) Citation

Song, F., Cui, N., Chen, S., Zhang, K., Liu, Y., Chen, X., & Tan, J. (2025). Beyond Performance of Learning Control Subject to Uncertainties and Noise: A Frequency-Domain Approach Applied to Wafer Stages. IEEE/CAA journal of automatica sinica, 12(1), 198-214. https://doi.org/10.1109/JAS.2024.124968

Chicago Style (17th ed.) Citation

Song, Fazhi, Ning Cui, Shuaiqi Chen, Kai Zhang, Yang Liu, Xinkai Chen, and Jiubin Tan. "Beyond Performance of Learning Control Subject to Uncertainties and Noise: A Frequency-Domain Approach Applied to Wafer Stages." IEEE/CAA Journal of Automatica Sinica 12, no. 1 (2025): 198-214. https://doi.org/10.1109/JAS.2024.124968.

MLA (9th ed.) Citation

Song, Fazhi, et al. "Beyond Performance of Learning Control Subject to Uncertainties and Noise: A Frequency-Domain Approach Applied to Wafer Stages." IEEE/CAA Journal of Automatica Sinica, vol. 12, no. 1, 2025, pp. 198-214, https://doi.org/10.1109/JAS.2024.124968.