Do, K., Lee, B., Jin, S., & Koo, Y. (2021). All-directional Electrostatic-discharge Protection Circuit with High Area-efficiency. Journal of semiconductor technology and science, 21(4), 270-278. https://doi.org/10.5573/JSTS.2021.21.4.270
Chicago Style (17th ed.) CitationDo, Kyoung-Il, Byung-Seok Lee, Seung-Hoo Jin, and Yong-Seo Koo. "All-directional Electrostatic-discharge Protection Circuit with High Area-efficiency." Journal of Semiconductor Technology and Science 21, no. 4 (2021): 270-278. https://doi.org/10.5573/JSTS.2021.21.4.270.
MLA (9th ed.) CitationDo, Kyoung-Il, et al. "All-directional Electrostatic-discharge Protection Circuit with High Area-efficiency." Journal of Semiconductor Technology and Science, vol. 21, no. 4, 2021, pp. 270-278, https://doi.org/10.5573/JSTS.2021.21.4.270.