Verweij, J. (1993). VLSI reliability in Europe. Proceedings of the IEEE, 81(5), 675-681. https://doi.org/10.1109/5.220899
Chicago Style (17th ed.) CitationVerweij, J.F. "VLSI Reliability in Europe." Proceedings of the IEEE 81, no. 5 (1993): 675-681. https://doi.org/10.1109/5.220899.
MLA (9th ed.) CitationVerweij, J.F. "VLSI Reliability in Europe." Proceedings of the IEEE, vol. 81, no. 5, 1993, pp. 675-681, https://doi.org/10.1109/5.220899.
Warning: These citations may not always be 100% accurate.