Symmetry quantification and segmentation in STEM imaging through Zernike moments

Abstract We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This technique is effective against common imaging noises and...

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Published inChinese physics B Vol. 33; no. 8; pp. 86803 - 86812
Main Authors Dan, Jiadong, Zhang, Cheng, Zhao, Xiaoxu, Duane Loh, N.
Format Journal Article
LanguageEnglish
Published Chinese Physical Society and IOP Publishing Ltd 01.07.2024
Subjects
scanning transmission electron microscopy (STEM)
segmentation
symmetry
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Abstract Abstract We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This technique is effective against common imaging noises and is potentially suited for low-dose imaging and identifying quantum defects. We showcase its utility in the unsupervised segmentation of polytypes in a twisted bilayer TaS 2 , enabling accurate differentiation of structural phases and monitoring transitions caused by electron beam effects. This approach enhances the analysis of structural variations in crystalline materials, marking a notable advancement in the characterization of structures in materials science.
AbstractList Abstract We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This technique is effective against common imaging noises and is potentially suited for low-dose imaging and identifying quantum defects. We showcase its utility in the unsupervised segmentation of polytypes in a twisted bilayer TaS 2 , enabling accurate differentiation of structural phases and monitoring transitions caused by electron beam effects. This approach enhances the analysis of structural variations in crystalline materials, marking a notable advancement in the characterization of structures in materials science.
Author Zhao, Xiaoxu
Duane Loh, N.
Zhang, Cheng
Dan, Jiadong
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  surname: Duane Loh
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  organization: Department of Physics, National University of Singapore , Singapore
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Snippet Abstract We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM)...
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StartPage 86803
SubjectTerms scanning transmission electron microscopy (STEM)
segmentation
symmetry
Title Symmetry quantification and segmentation in STEM imaging through Zernike moments
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