Symmetry quantification and segmentation in STEM imaging through Zernike moments

Abstract We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This technique is effective against common imaging noises and...

Full description

Saved in:
Bibliographic Details
Published inChinese physics B Vol. 33; no. 8; pp. 86803 - 86812
Main Authors Dan, Jiadong, Zhang, Cheng, Zhao, Xiaoxu, Duane Loh, N.
Format Journal Article
LanguageEnglish
Published Chinese Physical Society and IOP Publishing Ltd 01.07.2024
Subjects
scanning transmission electron microscopy (STEM)
segmentation
symmetry
Online AccessGet full text

Cover

More Information
Summary:Abstract We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This technique is effective against common imaging noises and is potentially suited for low-dose imaging and identifying quantum defects. We showcase its utility in the unsupervised segmentation of polytypes in a twisted bilayer TaS 2 , enabling accurate differentiation of structural phases and monitoring transitions caused by electron beam effects. This approach enhances the analysis of structural variations in crystalline materials, marking a notable advancement in the characterization of structures in materials science.
ISSN:1674-1056
2058-3834
DOI:10.1088/1674-1056/ad51f4