Optical and electrical study of CdZnTe surfaces passivated by KOH and NH4F solutions
•Surface of CdZnTe samples was passivated after chemical etching.•KOH and NH4F solutions were used as passivation agents.•Growth of surface oxide after passivation is observed.•Surface oxide thickness was evaluated over time after chemical treatment.•Oxidation of the sample correlates with decreased...
Saved in:
| Published in | Applied surface science Vol. 389; pp. 1214 - 1219 |
|---|---|
| Main Authors | , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Elsevier B.V
15.12.2016
|
| Subjects | |
| Online Access | Get full text |
Cover
Loading…
| Abstract | •Surface of CdZnTe samples was passivated after chemical etching.•KOH and NH4F solutions were used as passivation agents.•Growth of surface oxide after passivation is observed.•Surface oxide thickness was evaluated over time after chemical treatment.•Oxidation of the sample correlates with decreased leakage current.
Performance of CdZnTe-based detectors is highly related to surface preparation. Mechanical polishing, chemical etching and passivation are routinely employed for this purpose. However, the relation between these processes and the detector performance in terms of underlying physical phenomena has not been fully explained. The dynamics and properties of CdZnTe surface oxide layers, created by passivation with KOH and NH4F/H2O2 solutions, were studied by optical ellipsometry and X-ray photoelectron spectroscopy (XPS). Thicknesses and growth rates of the surface oxide layers differed for each of the passivation methods. Leakage currents which influence the final spectral resolution of the detector were measured simultaneously with ellipsometry. Results of both optical and electrical investigation showed the same trends in the time evolution and correlated to each other. NH4F/H2O2 passivation showed to be a method which produces the most desirable properties of the surface oxide layer. |
|---|---|
| AbstractList | •Surface of CdZnTe samples was passivated after chemical etching.•KOH and NH4F solutions were used as passivation agents.•Growth of surface oxide after passivation is observed.•Surface oxide thickness was evaluated over time after chemical treatment.•Oxidation of the sample correlates with decreased leakage current.
Performance of CdZnTe-based detectors is highly related to surface preparation. Mechanical polishing, chemical etching and passivation are routinely employed for this purpose. However, the relation between these processes and the detector performance in terms of underlying physical phenomena has not been fully explained. The dynamics and properties of CdZnTe surface oxide layers, created by passivation with KOH and NH4F/H2O2 solutions, were studied by optical ellipsometry and X-ray photoelectron spectroscopy (XPS). Thicknesses and growth rates of the surface oxide layers differed for each of the passivation methods. Leakage currents which influence the final spectral resolution of the detector were measured simultaneously with ellipsometry. Results of both optical and electrical investigation showed the same trends in the time evolution and correlated to each other. NH4F/H2O2 passivation showed to be a method which produces the most desirable properties of the surface oxide layer. |
| Author | Statelov, M. Franc, J. Moravec, P. Pekárek, J. Mašek, K. Veis, M. Zázvorka, J. |
| Author_xml | – sequence: 1 givenname: J. surname: Zázvorka fullname: Zázvorka, J. email: zazvorka.jakub@gmail.com, zazvorka@karlov.mff.cuni.cz organization: Institute of Physics, Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 5, 121 16 Prague, Czech Republic – sequence: 2 givenname: J. surname: Franc fullname: Franc, J. organization: Institute of Physics, Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 5, 121 16 Prague, Czech Republic – sequence: 3 givenname: M. surname: Statelov fullname: Statelov, M. organization: Institute of Physics, Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 5, 121 16 Prague, Czech Republic – sequence: 4 givenname: J. surname: Pekárek fullname: Pekárek, J. organization: Institute of Physics, Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 5, 121 16 Prague, Czech Republic – sequence: 5 givenname: M. surname: Veis fullname: Veis, M. organization: Institute of Physics, Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 5, 121 16 Prague, Czech Republic – sequence: 6 givenname: P. surname: Moravec fullname: Moravec, P. organization: Institute of Physics, Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 5, 121 16 Prague, Czech Republic – sequence: 7 givenname: K. surname: Mašek fullname: Mašek, K. organization: Department of Surface and Plasma Science, Faculty of Mathematics and Physics, Charles University in Prague, V Holešovičkách 2, CZ, 18000 Prague, Czech Republic |
| BookMark | eNp9kM1KAzEUhYNUsK2-gYu8wNT8zE-6EaRYKxa7qRs3IZPcQMo4M-TOFPr2pq1rV5dzDudw-WZk0nYtEPLI2YIzXj4dFqbHEe1CJLVgKrnyhky5qmRWFCqfkGkKllkupbgjM8QDY1ykdEr2u34I1jTUtI5CA3aIF4nD6E6083Tlvts9UByjNxaQ9gYxHM0AjtYn-rHbXJqfm3xNsWvGIXQt3pNbbxqEh787J1_r1_1qk213b--rl21mhSyHrFbcGyYqoVzBjXJW-Aq8VEtTQel9aSpfeL6sRclkzQ34Ihe5BSiL3JfCGjkn-XXXxg4xgtd9DD8mnjRn-kxGH_SVjD6T0UwlV6ba87UG6bdjgKjRBmgtuBATAO268P_ALyu7cQs |
| CitedBy_id | crossref_primary_10_1016_j_mssp_2022_106809 crossref_primary_10_1016_j_nima_2023_168229 crossref_primary_10_1007_s11664_018_6371_x crossref_primary_10_1007_s10854_018_9002_7 crossref_primary_10_1016_j_net_2022_08_016 crossref_primary_10_2478_msp_2019_0030 crossref_primary_10_1088_1361_6641_aa7500 crossref_primary_10_1016_j_net_2024_06_007 crossref_primary_10_3390_cryst13040693 crossref_primary_10_1016_j_apradiso_2023_110914 crossref_primary_10_1088_1361_6463_ac0c4a crossref_primary_10_3390_s24123861 |
| Cites_doi | 10.1109/TNS.2009.2022831 10.1016/j.nima.2006.06.033 10.1007/s11664-013-2649-1 10.1016/S0168-9002(98)01574-5 10.1016/S0927-796X(01)00027-4 10.1016/j.apsusc.2006.07.060 10.1016/j.jcrysgro.2010.03.045 10.1007/s11664-999-0067-1 10.1007/s11664-997-0189-2 10.1116/1.584278 10.1007/s11664-007-0176-7 10.1016/j.apsusc.2010.12.103 10.1002/sia.3146 10.1007/s11664-008-0431-6 10.1063/1.433874 10.1088/0034-4885/12/1/308 10.1016/j.apsusc.2007.10.064 10.1117/12.937953 10.1109/TNS.2004.829654 10.1016/j.matlet.2008.09.051 10.1063/1.347181 10.1109/TNS.2007.905171 10.1016/j.apsusc.2014.07.104 10.1109/TNS.2011.2157703 |
| ContentType | Journal Article |
| Copyright | 2016 Elsevier B.V. |
| Copyright_xml | – notice: 2016 Elsevier B.V. |
| DBID | AAYXX CITATION |
| DOI | 10.1016/j.apsusc.2016.08.103 |
| DatabaseName | CrossRef |
| DatabaseTitle | CrossRef |
| DatabaseTitleList | |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 1873-5584 |
| EndPage | 1219 |
| ExternalDocumentID | 10_1016_j_apsusc_2016_08_103 S0169433216317469 |
| GroupedDBID | --K --M -~X .~1 0R~ 1B1 1RT 1~. 1~5 23M 4.4 457 4G. 5GY 5VS 6J9 7-5 71M 8P~ 9JN AABNK AABXZ AACTN AAEDT AAEDW AAEPC AAIAV AAIKJ AAKOC AALRI AAOAW AAQFI AARLI AAXUO ABFNM ABFRF ABJNI ABMAC ABNEU ABXRA ABYKQ ACBEA ACDAQ ACFVG ACGFO ACGFS ACRLP ADBBV ADECG ADEZE AEBSH AEFWE AEKER AENEX AEZYN AFKWA AFRZQ AFTJW AFZHZ AGHFR AGUBO AGYEJ AHHHB AIEXJ AIKHN AITUG AIVDX AJBFU AJOXV AJSZI ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ AXJTR BKOJK BLXMC CS3 EBS EFJIC EFLBG EJD EO8 EO9 EP2 EP3 F5P FDB FIRID FLBIZ FNPLU FYGXN G-Q GBLVA IHE J1W KOM M24 M38 M41 MAGPM MO0 N9A O-L O9- OAUVE OGIMB OZT P-8 P-9 P2P PC. Q38 RIG RNS ROL RPZ SCB SDF SDG SDP SES SMS SPC SPCBC SPD SPG SSK SSM SSQ SSZ T5K TN5 WH7 XPP ZMT ~02 ~G- AAQXK AAXKI AAYXX ABXDB ACNNM ADMUD AFJKZ AKRWK ASPBG AVWKF AZFZN BBWZM CITATION FEDTE FGOYB G-2 HMV HVGLF HZ~ NDZJH R2- SEW WUQ |
| ID | FETCH-LOGICAL-c236t-b81fa02728d51a8dc2f7ef389a7e6ff6a7f5f19b2603b1aef5424cee654f62ca3 |
| IEDL.DBID | .~1 |
| ISSN | 0169-4332 |
| IngestDate | Thu Sep 26 19:39:20 EDT 2024 Fri Feb 23 02:22:57 EST 2024 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Keywords | Leakage current Surface oxide CdTe Passivation Ellipsometry |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c236t-b81fa02728d51a8dc2f7ef389a7e6ff6a7f5f19b2603b1aef5424cee654f62ca3 |
| PageCount | 6 |
| ParticipantIDs | crossref_primary_10_1016_j_apsusc_2016_08_103 elsevier_sciencedirect_doi_10_1016_j_apsusc_2016_08_103 |
| PublicationCentury | 2000 |
| PublicationDate | 2016-12-15 |
| PublicationDateYYYYMMDD | 2016-12-15 |
| PublicationDate_xml | – month: 12 year: 2016 text: 2016-12-15 day: 15 |
| PublicationDecade | 2010 |
| PublicationTitle | Applied surface science |
| PublicationYear | 2016 |
| Publisher | Elsevier B.V |
| Publisher_xml | – name: Elsevier B.V |
| References | Duff, Hunter, Burger, Groza, Buliga, Black (bib0010) 2008; 254 Bahl, Watson, Irgolic (bib0120) 1977; 66 Badano, Million, Canava, Tran-Van, Etcheberry (bib0090) 2007; 36 Cavallini, Castaldini, Cavalcoli, Fraboni (bib0050) 2007; 54 Schlesinger, Toney, Yoon, Lee, Brunett, Franks (bib0020) 2001; 32 Choi, Lucovsky (bib0080) 1988; 6 Yoon, Scyoc, Goorsky (bib0065) 1997; 26 Zha, Jie, Tan, Li (bib0070) 2007; 253 Marchini, Zappettini, Gombia, Mosca, Lanata, Pavesi (bib0030) 2009; 56 Yao, Erickson, Barber, James, Hermon (bib0085) 1999; 28 Bensalah, Plaza, Crocco, Zheng, Carcelen, Bensouici (bib0025) 2011; 257 Zha, Jie, Tan, Wang (bib0115) 2006; 566 Hossain, Bolotnikov, Camarda, Cui, Babalola, Burger (bib0055) 2008; 37 Nelson, Conway, Reinhardt, Ferreira, Nikolic, Payne (bib0015) 2009; 63 Burger, Chen, Chattopadhyay, Shi, Morgan, Collins (bib0125) 1999; 428 Crocco, Bensalah, Zheng, Dierre, Hidalgo, Carrascal (bib0045) 2011 Morita, Ohmi, Hasegawa, Kawakami, Ohwada (bib0110) 1990; 68 Gnatyuk, Vlasenko, Levytskyi, Dieguez, Crocco, Bensalah (bib0040) 2012; 8507 Zazvorka, Franc, Moravec, Jesenska, Sedivy, Ulrych (bib0095) 2014; 315 Burger, Chen, Chattopadhyay, Shi, Morgan, Collins (bib0035) 1999; 428 Cabrera, Mott (bib0105) 1948; 12 Tari, Aqariden, Chang, Grein, Li, Kioussis (bib0075) 2013; 42 Özsan, Sellin, Veeramani, Hinder, Monnier, Prekas (bib0100) 2010; 42 Cui, Groza, Burger, James (bib0005) 2004; 51 Bensouici, Carcelen, Plaza, De Dios, Vijayan, Crocco (bib0060) 2010; 312 Cabrera (10.1016/j.apsusc.2016.08.103_bib0105) 1948; 12 Nelson (10.1016/j.apsusc.2016.08.103_bib0015) 2009; 63 Cui (10.1016/j.apsusc.2016.08.103_bib0005) 2004; 51 Yao (10.1016/j.apsusc.2016.08.103_bib0085) 1999; 28 Bensouici (10.1016/j.apsusc.2016.08.103_bib0060) 2010; 312 Choi (10.1016/j.apsusc.2016.08.103_bib0080) 1988; 6 Schlesinger (10.1016/j.apsusc.2016.08.103_bib0020) 2001; 32 Cavallini (10.1016/j.apsusc.2016.08.103_bib0050) 2007; 54 Zazvorka (10.1016/j.apsusc.2016.08.103_bib0095) 2014; 315 Marchini (10.1016/j.apsusc.2016.08.103_bib0030) 2009; 56 Bahl (10.1016/j.apsusc.2016.08.103_bib0120) 1977; 66 Bensalah (10.1016/j.apsusc.2016.08.103_bib0025) 2011; 257 Badano (10.1016/j.apsusc.2016.08.103_bib0090) 2007; 36 Zha (10.1016/j.apsusc.2016.08.103_bib0115) 2006; 566 Duff (10.1016/j.apsusc.2016.08.103_bib0010) 2008; 254 Burger (10.1016/j.apsusc.2016.08.103_bib0035) 1999; 428 Tari (10.1016/j.apsusc.2016.08.103_bib0075) 2013; 42 Morita (10.1016/j.apsusc.2016.08.103_bib0110) 1990; 68 Burger (10.1016/j.apsusc.2016.08.103_bib0125) 1999; 428 Gnatyuk (10.1016/j.apsusc.2016.08.103_bib0040) 2012; 8507 Yoon (10.1016/j.apsusc.2016.08.103_bib0065) 1997; 26 Zha (10.1016/j.apsusc.2016.08.103_bib0070) 2007; 253 Crocco (10.1016/j.apsusc.2016.08.103_bib0045) 2011 Özsan (10.1016/j.apsusc.2016.08.103_bib0100) 2010; 42 Hossain (10.1016/j.apsusc.2016.08.103_bib0055) 2008; 37 |
| References_xml | – volume: 312 start-page: 2098 year: 2010 end-page: 2102 ident: bib0060 article-title: Study of effects of polishing and etching processes on Cd1-xZnxTe surface quality publication-title: J. Cryst. Growth contributor: fullname: Crocco – volume: 63 start-page: 180 year: 2009 end-page: 181 ident: bib0015 article-title: X-ray photoemission analysis of passivated Cd(1 publication-title: Mater. Lett. contributor: fullname: Payne – volume: 566 start-page: 495 year: 2006 end-page: 499 ident: bib0115 article-title: Effect of surface treatments on the electrical and optical properties of CdZnTe single crystal publication-title: Nucl. Instrum. Methods Phys. Res. Sect. A contributor: fullname: Wang – volume: 54 start-page: 1719 year: 2007 end-page: 1722 ident: bib0050 article-title: Photocurrent and surface photovoltage spectroscopy investigations of CdTe-based compounds publication-title: IEEE Trans. Nucl. Sci. contributor: fullname: Fraboni – volume: 6 start-page: 1198 year: 1988 ident: bib0080 article-title: Native oxide formation on CdTe publication-title: J. Vac. Sci. Technol. B contributor: fullname: Lucovsky – volume: 28 start-page: 760 year: 1999 end-page: 765 ident: bib0085 article-title: Optical properties of Cd0.9Zn0.1 Te studied by variable angle spectroscopic ellipsometry between 0.75 and 6.24 eV publication-title: J. Electron. Mater. contributor: fullname: Hermon – volume: 42 start-page: 795 year: 2010 end-page: 798 ident: bib0100 article-title: Chemical etching and surface oxidation studies of cadmium zinc telluride radiation detectors publication-title: Surf. Interface Anal. contributor: fullname: Prekas – volume: 68 start-page: 1272 year: 1990 ident: bib0110 article-title: Growth of native oxide on a silicon surface publication-title: J. Appl. Phys. contributor: fullname: Ohwada – volume: 12 start-page: 163 year: 1948 end-page: 184 ident: bib0105 article-title: Theory of the oxidation of metals publication-title: Rep. Prog. Phys. contributor: fullname: Mott – volume: 26 start-page: 529 year: 1997 end-page: 533 ident: bib0065 article-title: Investigation of the effects of polishing and etching on the quality of cd1-xZnxTe using spatial mapping techniques publication-title: J. Electron. Mater. contributor: fullname: Goorsky – volume: 254 start-page: 2889 year: 2008 end-page: 2892 ident: bib0010 article-title: Effect of surface preparation technique on the radiation detector performance of CdZnTe publication-title: Appl. Surf. Sci. contributor: fullname: Black – volume: 257 start-page: 4633 year: 2011 end-page: 4636 ident: bib0025 article-title: The effect of etching time on the CdZnTe surface publication-title: Appl. Surf. Sci. contributor: fullname: Bensouici – volume: 253 start-page: 3476 year: 2007 end-page: 3479 ident: bib0070 article-title: The surface leakage currents of CdZnTe wafers publication-title: Appl. Surf. Sci. contributor: fullname: Li – volume: 66 start-page: 5526 year: 1977 ident: bib0120 article-title: X-ray photoemission studies of tellurium and some of its compounds publication-title: J. Chem. Phys. contributor: fullname: Irgolic – volume: 315 start-page: 144 year: 2014 end-page: 148 ident: bib0095 article-title: Contactless resistivity and photoconductivity correlation to surface preparation of CdZnTe publication-title: Appl. Surf. Sci. contributor: fullname: Ulrych – volume: 42 start-page: 3252 year: 2013 end-page: 3258 ident: bib0075 article-title: Impact of surface treatment on the structural and electronic properties of polished CdZnTe surfaces for radiation detectors publication-title: J. Electron. Mater. contributor: fullname: Kioussis – volume: 8507 start-page: 85071S year: 2012 ident: bib0040 article-title: Surface processing of CdZnTe crystals publication-title: Proc. SPIE contributor: fullname: Bensalah – volume: 51 start-page: 1172 year: 2004 end-page: 1175 ident: bib0005 article-title: Effects of surface processing on the performance of cdl-xZnxTe radiation detectors publication-title: IEEE Trans. Nucl Sci. contributor: fullname: James – volume: 36 start-page: 1077 year: 2007 end-page: 1084 ident: bib0090 article-title: Fast detection of precipitates and oxides on CdZnTe surfaces by spectroscopic ellipsometry publication-title: J. Electron. Mater. contributor: fullname: Etcheberry – volume: 428 start-page: 8 year: 1999 end-page: 13 ident: bib0035 article-title: Characterization of metal contacts on and surfaces of cadmium zinc telluride publication-title: Nucl. Instrum. Methods Phys. Res. Sect. A contributor: fullname: Collins – volume: 37 start-page: 1356 year: 2008 end-page: 1361 ident: bib0055 article-title: Effects of surface processing on the response of CZT gamma detectors: studies with a collimated synchrotron X-ray beam publication-title: J. Electron. Mater. contributor: fullname: Burger – volume: 428 start-page: 8 year: 1999 end-page: 13 ident: bib0125 article-title: Characterization of metal contacts on and surfaces of cadmium zinc telluride publication-title: Nucl. Instrum. Methods Phys. Res. Sect. A contributor: fullname: Collins – volume: 56 start-page: 1823 year: 2009 end-page: 1826 ident: bib0030 article-title: Study of surface treatment effects on the metal-CdZnTe interface publication-title: IEEE Trans. Nucl. Sci. contributor: fullname: Pavesi – start-page: 1935 year: 2011 end-page: 1941 ident: bib0045 article-title: Study of the effects of edge morphology on detector performance by leakage current and cathodoluminescence publication-title: IEEE Trans. Nucl. Sci. contributor: fullname: Carrascal – volume: 32 start-page: 103 year: 2001 end-page: 189 ident: bib0020 article-title: Cadmium zinc telluride and its use as a nuclear radiation detector material publication-title: Mater. Sci. Eng. R. Rep. contributor: fullname: Franks – volume: 56 start-page: 1823 year: 2009 ident: 10.1016/j.apsusc.2016.08.103_bib0030 article-title: Study of surface treatment effects on the metal-CdZnTe interface publication-title: IEEE Trans. Nucl. Sci. doi: 10.1109/TNS.2009.2022831 contributor: fullname: Marchini – volume: 566 start-page: 495 year: 2006 ident: 10.1016/j.apsusc.2016.08.103_bib0115 article-title: Effect of surface treatments on the electrical and optical properties of CdZnTe single crystal publication-title: Nucl. Instrum. Methods Phys. Res. Sect. A doi: 10.1016/j.nima.2006.06.033 contributor: fullname: Zha – volume: 42 start-page: 3252 year: 2013 ident: 10.1016/j.apsusc.2016.08.103_bib0075 article-title: Impact of surface treatment on the structural and electronic properties of polished CdZnTe surfaces for radiation detectors publication-title: J. Electron. Mater. doi: 10.1007/s11664-013-2649-1 contributor: fullname: Tari – volume: 428 start-page: 8 year: 1999 ident: 10.1016/j.apsusc.2016.08.103_bib0035 article-title: Characterization of metal contacts on and surfaces of cadmium zinc telluride publication-title: Nucl. Instrum. Methods Phys. Res. Sect. A doi: 10.1016/S0168-9002(98)01574-5 contributor: fullname: Burger – volume: 32 start-page: 103 year: 2001 ident: 10.1016/j.apsusc.2016.08.103_bib0020 article-title: Cadmium zinc telluride and its use as a nuclear radiation detector material publication-title: Mater. Sci. Eng. R. Rep. doi: 10.1016/S0927-796X(01)00027-4 contributor: fullname: Schlesinger – volume: 253 start-page: 3476 year: 2007 ident: 10.1016/j.apsusc.2016.08.103_bib0070 article-title: The surface leakage currents of CdZnTe wafers publication-title: Appl. Surf. Sci. doi: 10.1016/j.apsusc.2006.07.060 contributor: fullname: Zha – volume: 312 start-page: 2098 year: 2010 ident: 10.1016/j.apsusc.2016.08.103_bib0060 article-title: Study of effects of polishing and etching processes on Cd1-xZnxTe surface quality publication-title: J. Cryst. Growth doi: 10.1016/j.jcrysgro.2010.03.045 contributor: fullname: Bensouici – volume: 28 start-page: 760 year: 1999 ident: 10.1016/j.apsusc.2016.08.103_bib0085 article-title: Optical properties of Cd0.9Zn0.1 Te studied by variable angle spectroscopic ellipsometry between 0.75 and 6.24 eV publication-title: J. Electron. Mater. doi: 10.1007/s11664-999-0067-1 contributor: fullname: Yao – volume: 26 start-page: 529 year: 1997 ident: 10.1016/j.apsusc.2016.08.103_bib0065 article-title: Investigation of the effects of polishing and etching on the quality of cd1-xZnxTe using spatial mapping techniques publication-title: J. Electron. Mater. doi: 10.1007/s11664-997-0189-2 contributor: fullname: Yoon – volume: 6 start-page: 1198 year: 1988 ident: 10.1016/j.apsusc.2016.08.103_bib0080 article-title: Native oxide formation on CdTe publication-title: J. Vac. Sci. Technol. B doi: 10.1116/1.584278 contributor: fullname: Choi – volume: 36 start-page: 1077 year: 2007 ident: 10.1016/j.apsusc.2016.08.103_bib0090 article-title: Fast detection of precipitates and oxides on CdZnTe surfaces by spectroscopic ellipsometry publication-title: J. Electron. Mater. doi: 10.1007/s11664-007-0176-7 contributor: fullname: Badano – volume: 428 start-page: 8 year: 1999 ident: 10.1016/j.apsusc.2016.08.103_bib0125 article-title: Characterization of metal contacts on and surfaces of cadmium zinc telluride publication-title: Nucl. Instrum. Methods Phys. Res. Sect. A doi: 10.1016/S0168-9002(98)01574-5 contributor: fullname: Burger – volume: 257 start-page: 4633 year: 2011 ident: 10.1016/j.apsusc.2016.08.103_bib0025 article-title: The effect of etching time on the CdZnTe surface publication-title: Appl. Surf. Sci. doi: 10.1016/j.apsusc.2010.12.103 contributor: fullname: Bensalah – volume: 42 start-page: 795 year: 2010 ident: 10.1016/j.apsusc.2016.08.103_bib0100 article-title: Chemical etching and surface oxidation studies of cadmium zinc telluride radiation detectors publication-title: Surf. Interface Anal. doi: 10.1002/sia.3146 contributor: fullname: Özsan – volume: 37 start-page: 1356 year: 2008 ident: 10.1016/j.apsusc.2016.08.103_bib0055 article-title: Effects of surface processing on the response of CZT gamma detectors: studies with a collimated synchrotron X-ray beam publication-title: J. Electron. Mater. doi: 10.1007/s11664-008-0431-6 contributor: fullname: Hossain – volume: 66 start-page: 5526 year: 1977 ident: 10.1016/j.apsusc.2016.08.103_bib0120 article-title: X-ray photoemission studies of tellurium and some of its compounds publication-title: J. Chem. Phys. doi: 10.1063/1.433874 contributor: fullname: Bahl – volume: 12 start-page: 163 year: 1948 ident: 10.1016/j.apsusc.2016.08.103_bib0105 article-title: Theory of the oxidation of metals publication-title: Rep. Prog. Phys. doi: 10.1088/0034-4885/12/1/308 contributor: fullname: Cabrera – volume: 254 start-page: 2889 year: 2008 ident: 10.1016/j.apsusc.2016.08.103_bib0010 article-title: Effect of surface preparation technique on the radiation detector performance of CdZnTe publication-title: Appl. Surf. Sci. doi: 10.1016/j.apsusc.2007.10.064 contributor: fullname: Duff – volume: 8507 start-page: 85071S year: 2012 ident: 10.1016/j.apsusc.2016.08.103_bib0040 article-title: Surface processing of CdZnTe crystals publication-title: Proc. SPIE doi: 10.1117/12.937953 contributor: fullname: Gnatyuk – volume: 51 start-page: 1172 year: 2004 ident: 10.1016/j.apsusc.2016.08.103_bib0005 article-title: Effects of surface processing on the performance of cdl-xZnxTe radiation detectors publication-title: IEEE Trans. Nucl Sci. doi: 10.1109/TNS.2004.829654 contributor: fullname: Cui – volume: 63 start-page: 180 year: 2009 ident: 10.1016/j.apsusc.2016.08.103_bib0015 article-title: X-ray photoemission analysis of passivated Cd(1−x)ZnxTe surfaces for improved radiation detectors publication-title: Mater. Lett. doi: 10.1016/j.matlet.2008.09.051 contributor: fullname: Nelson – volume: 68 start-page: 1272 year: 1990 ident: 10.1016/j.apsusc.2016.08.103_bib0110 article-title: Growth of native oxide on a silicon surface publication-title: J. Appl. Phys. doi: 10.1063/1.347181 contributor: fullname: Morita – volume: 54 start-page: 1719 year: 2007 ident: 10.1016/j.apsusc.2016.08.103_bib0050 article-title: Photocurrent and surface photovoltage spectroscopy investigations of CdTe-based compounds publication-title: IEEE Trans. Nucl. Sci. doi: 10.1109/TNS.2007.905171 contributor: fullname: Cavallini – volume: 315 start-page: 144 year: 2014 ident: 10.1016/j.apsusc.2016.08.103_bib0095 article-title: Contactless resistivity and photoconductivity correlation to surface preparation of CdZnTe publication-title: Appl. Surf. Sci. doi: 10.1016/j.apsusc.2014.07.104 contributor: fullname: Zazvorka – start-page: 1935 year: 2011 ident: 10.1016/j.apsusc.2016.08.103_bib0045 article-title: Study of the effects of edge morphology on detector performance by leakage current and cathodoluminescence publication-title: IEEE Trans. Nucl. Sci. doi: 10.1109/TNS.2011.2157703 contributor: fullname: Crocco |
| SSID | ssj0012873 |
| Score | 2.3223505 |
| Snippet | •Surface of CdZnTe samples was passivated after chemical etching.•KOH and NH4F solutions were used as passivation agents.•Growth of surface oxide after... |
| SourceID | crossref elsevier |
| SourceType | Aggregation Database Publisher |
| StartPage | 1214 |
| SubjectTerms | CdTe Ellipsometry Leakage current Passivation Surface oxide |
| Title | Optical and electrical study of CdZnTe surfaces passivated by KOH and NH4F solutions |
| URI | https://dx.doi.org/10.1016/j.apsusc.2016.08.103 |
| Volume | 389 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV07T8MwELaqssCAeIrykgdW0yZ2nGSsKqpARTvQShVLZMc-qQxp1MfAwm_nnEdVGBgYbcVSdDndfed89x0hDwFYGSmhWAxKMsFNxrBslsxAJiQHMLFxVwOvY5nMxMs8mLfIoOmFcbTKOvZXMb2M1vVOt7Zmt1gsum9OR8SpbyGiQFgtXROfwGSEPv34taN5YPit_jLjw647yG_a50qOl8JKdO2EDD3phDy9ZnTW7_S0l3KGJ-S4xoq0X73OKWnZ_Iwc7SkInpPppCgvo6nKDa1G2pTLUjWWLoEOzHs-tXS9XYEjX9ECwbIbaGYN1Z90NEnKk-NEDOnOCy_IbPg0HSSsHpTAMp_LDdORBwrrSz8ygacik_kQWkAookIrAaQKIQAv1li7cO0pC4HwBWZHGQiQfqb4JWnny9xeEapji4hGR1xmkeACYit7QkmtY67jLIw6hDX2SYtKDyNtiGIfaWXP1Nkz7UW4yzskbIyY_viuKYbsP09e__vkDTl0K0c68YJb0t6stvYOocNG35e-cU8O-s-jZPwNExrEcg |
| link.rule.ids | 315,786,790,4521,24144,27957,27958,45620,45714 |
| linkProvider | Elsevier |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV07T8MwED5BOwAD4inK0wNrVBI7TjxWFVWgNAy0UsUS2bFPgiGN-hj499h5IGBgYIyjk6yLdfd9zt13ALchGh5LJj2BknuM6tyztJl7GnPGKaIW2l0NTFKezNjjPJxvwbDthXFllU3sr2N6Fa2blX7jzX759tZ_cToiTn3LIgoLq7nYhi4LI591oDt4GCfp188ESwpoLfEtXINQ0HbQVWVe0pLRldMy9LnT8vTb6Vm_M9S3rDM6gP0GLpJBvaND2DLFEex9ExE8hulzWd1HE1loUk-1qR4r4ViyQDLUr8XUkNVmia7-ipQWL7uZZkYT9UHGz0llmSZsRL4O4gnMRvfTYeI1sxK8PKB87anYR2kpZhDr0JexzgOMDFo0IiPDEbmMMERfKEtfqPKlwZAFzCZIHjLkQS7pKXSKRWHOgChhLKhRMeV5zChDYfgdk1wpQZXIo7gHXuufrKwlMbK2Vuw9q_2ZOX9md7FdpT2IWidmPz5tZqP2n5bn_7a8gZ1kOnnKnh7S8QXsujeuBsUPL6GzXm7MlUUSa3XdnJRP7o_HKA |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Optical+and+electrical+study+of+CdZnTe+surfaces+passivated+by+KOH+and+NH4F+solutions&rft.jtitle=Applied+surface+science&rft.au=Z%C3%A1zvorka%2C+J.&rft.au=Franc%2C+J.&rft.au=Statelov%2C+M.&rft.au=Pek%C3%A1rek%2C+J.&rft.date=2016-12-15&rft.issn=0169-4332&rft.volume=389&rft.spage=1214&rft.epage=1219&rft_id=info:doi/10.1016%2Fj.apsusc.2016.08.103&rft.externalDBID=n%2Fa&rft.externalDocID=10_1016_j_apsusc_2016_08_103 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0169-4332&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0169-4332&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0169-4332&client=summon |