APA (7th ed.) Citation

Kong, B. (2025). Fault-tolerant Algebraic Interleaver Architecture for IDMA Systems in Harsh Environments. Journal of semiconductor technology and science, 25(2), 191-198. https://doi.org/10.5573/JSTS.2025.25.2.191

Chicago Style (17th ed.) Citation

Kong, Byeong-Yong. "Fault-tolerant Algebraic Interleaver Architecture for IDMA Systems in Harsh Environments." Journal of Semiconductor Technology and Science 25, no. 2 (2025): 191-198. https://doi.org/10.5573/JSTS.2025.25.2.191.

MLA (9th ed.) Citation

Kong, Byeong-Yong. "Fault-tolerant Algebraic Interleaver Architecture for IDMA Systems in Harsh Environments." Journal of Semiconductor Technology and Science, vol. 25, no. 2, 2025, pp. 191-198, https://doi.org/10.5573/JSTS.2025.25.2.191.