Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration- Corrected Scanning Transmission Electron Microscope with a Large Solid- Angle Detector

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 18; no. S2; pp. 974 - 975
Main Authors Watanabe, M., Yasuhara, A., Okunishi, E.
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.07.2012
Oxford University Press
Subjects
Electron microscopes
Instrumentation Symposium
Microscopy
Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-02
Quantitative analysis
Sensors
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Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612006721