APA (7th ed.) Citation

Kumar, A., & Saini, M. (2018). Stochastic modeling and cost-benefit analysis of computing device with fault detection subject to expert repair facility. International journal of information technology (Singapore. Online), 10(3), 391-401. https://doi.org/10.1007/s41870-018-0082-7

Chicago Style (17th ed.) Citation

Kumar, Ashish, and Monika Saini. "Stochastic Modeling and Cost-benefit Analysis of Computing Device with Fault Detection Subject to Expert Repair Facility." International Journal of Information Technology (Singapore. Online) 10, no. 3 (2018): 391-401. https://doi.org/10.1007/s41870-018-0082-7.

MLA (9th ed.) Citation

Kumar, Ashish, and Monika Saini. "Stochastic Modeling and Cost-benefit Analysis of Computing Device with Fault Detection Subject to Expert Repair Facility." International Journal of Information Technology (Singapore. Online), vol. 10, no. 3, 2018, pp. 391-401, https://doi.org/10.1007/s41870-018-0082-7.