Atmospheric adsorption effects in hot-wire chemical-vapor-deposition microcrystalline silicon films with different electrode configurations

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Bibliographic Details
Published inSemiconductors (Woodbury, N.Y.) Vol. 39; no. 3; pp. 343 - 346
Main Authors Persheyev, S. K., Smirnov, V., O’Neill, K. A., Reynolds, S., Rose, M. J.
Format Journal Article
LanguageEnglish
Published 01.03.2005
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ISSN:1063-7826
1090-6479
DOI:10.1134/1.1882798