System Level Modeling of the Relevant Physical Effects of Inertial Sensors Using Order Reduction Methods
Sensor development in the field of microsystem technology is driven by steadily increasing demands on sensor resolution and performance and the need to reduce costs. Thus, interactions between mechanical and electronic components of a complex sensor system become more important and have to be consid...
Saved in:
Published in | Analog integrated circuits and signal processing Vol. 44; no. 2; pp. 129 - 135 |
---|---|
Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
01.08.2005
|
Online Access | Get full text |
Cover
Loading…
Abstract | Sensor development in the field of microsystem technology is driven by steadily increasing demands on sensor resolution and performance and the need to reduce costs. Thus, interactions between mechanical and electronic components of a complex sensor system become more important and have to be considered in the design process, preferably already in early design steps. That is why a system simulation of the entire sensor system is necessary to be able to verify different design steps and to decrease the number of expensive prototyping cycles. Due to typical combinations of different physical domains (mechanics, electronics, thermodynamics, etc.) a simulation of the entire system based on partial differential equations using e.g. finite element methods (FEM) is often impossible or too expensive concerning computing time. Furthermore, many details of the component behavior calculated by FEM are not needed at system level. A successful approach to system simulation of sensor systems is to derive behavioral models from FEM descriptions and to combine them with system level models of electronics. In the following a method for automatic generation of behavioral models for micromechanical components using order reduction methods will be introduced. |
---|---|
AbstractList | Sensor development in the field of microsystem technology is driven by steadily increasing demands on sensor resolution and performance and the need to reduce costs. Thus, interactions between mechanical and electronic components of a complex sensor system become more important and have to be considered in the design process, preferably already in early design steps. That is why a system simulation of the entire sensor system is necessary to be able to verify different design steps and to decrease the number of expensive prototyping cycles. Due to typical combinations of different physical domains (mechanics, electronics, thermodynamics, etc.) a simulation of the entire system based on partial differential equations using e.g. finite element methods (FEM) is often impossible or too expensive concerning computing time. Furthermore, many details of the component behavior calculated by FEM are not needed at system level. A successful approach to system simulation of sensor systems is to derive behavioral models from FEM descriptions and to combine them with system level models of electronics. In the following a method for automatic generation of behavioral models for micromechanical components using order reduction methods will be introduced. |
Author | Reitz, Sven Döring, Christian Schneider, Peter Schwarz, Peter Neul, Reinhard Bastian, Jens |
Author_xml | – sequence: 1 givenname: Sven surname: Reitz fullname: Reitz, Sven – sequence: 2 givenname: Christian surname: Döring fullname: Döring, Christian – sequence: 3 givenname: Jens surname: Bastian fullname: Bastian, Jens – sequence: 4 givenname: Peter surname: Schneider fullname: Schneider, Peter – sequence: 5 givenname: Peter surname: Schwarz fullname: Schwarz, Peter – sequence: 6 givenname: Reinhard surname: Neul fullname: Neul, Reinhard |
BookMark | eNotkEFPwjAYhhuDiYj-AG89eZt-XRldj4agkkAwIuema7-6mbFiW0j272XB05u8ed738NySUec7JOSBwRMDEM-RwVRABlBkeSF51l-RMSsEz5gUckTGIPMiY8DhhtzG-AMAuZjCmNTbPibc0xWesKVrb7Ftum_qHU010k9s8aS7RD_qPjZGt3ThHJoUB2DZYUjNudtiF32IdBeH6SZYDOelPZrU-I6uMdXexjty7XQb8f4_J2T3uviav2erzdty_rLKTJ6XKZN8yrkoStCVNmD4zEisCmFy1MJpYyorCgEWbOUYurw02lYzcGVhQUrGDZ-Qx8vvIfjfI8ak9k002La6Q3-MKpcghOBwBtkFNMHHGNCpQ2j2OvSKgRqcqotTdXaqBqeq5394123t |
Cites_doi | 10.1080/00207178708934040 10.1090/conm/280/04630 10.1109/DAC.1999.781223 10.1109/5.929650 10.1017/CBO9780511550157.004 10.1117/12.462833 10.1007/978-3-322-96758-9 |
ContentType | Journal Article |
DBID | AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D |
DOI | 10.1007/s10470-005-2593-y |
DatabaseName | CrossRef Computer and Information Systems Abstracts Electronics & Communications Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional |
DatabaseTitle | CrossRef Technology Research Database Computer and Information Systems Abstracts – Academic Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional |
DatabaseTitleList | Technology Research Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1573-1979 |
EndPage | 135 |
ExternalDocumentID | 10_1007_s10470_005_2593_y |
GroupedDBID | -5B -5G -BR -EM -Y2 -~C .86 .DC .VR 06D 0R~ 0VY 199 1N0 1SB 2.D 203 23M 28- 29~ 2J2 2JN 2JY 2KG 2KM 2LR 2P1 2VQ 2~H 30V 4.4 406 408 409 40D 40E 5GY 5QI 5VS 67Z 6NX 78A 8TC 8UJ 95- 95. 95~ 96X AAAVM AABHQ AACDK AAEOY AAHNG AAIAL AAJBT AAJKR AANZL AARHV AARTL AASML AATNV AATVU AAUYE AAWCG AAYIU AAYQN AAYTO AAYXX ABAKF ABBBX ABBXA ABDZT ABECU ABFTV ABHLI ABHQN ABJNI ABJOX ABKCH ABKTR ABMNI ABMQK ABNWP ABQBU ABSXP ABTEG ABTHY ABTKH ABTMW ABULA ABWNU ABXPI ACAOD ACBXY ACDTI ACGFS ACHSB ACHXU ACIPQ ACIWK ACKNC ACMDZ ACMLO ACOKC ACOMO ACZOJ ADHHG ADHIR ADINQ ADKNI ADKPE ADRFC ADTPH ADURQ ADYFF ADZKW AEBTG AEFIE AEFQL AEGAL AEGNC AEJHL AEJRE AEKMD AEMSY AENEX AEOHA AEPYU AESKC AETLH AEVLU AEXYK AFBBN AFEXP AFGCZ AFLOW AFQWF AFWTZ AFZKB AGAYW AGDGC AGGDS AGJBK AGMZJ AGQEE AGQMX AGRTI AGWIL AGWZB AGYKE AHAVH AHBYD AHKAY AHSBF AHYZX AIAKS AIGIU AIIXL AILAN AITGF AJBLW AJRNO AJZVZ ALMA_UNASSIGNED_HOLDINGS ALWAN AMKLP AMXSW AMYLF AMYQR AOCGG ARCEE ARMRJ ASPBG AVWKF AXYYD AYJHY AZFZN B-. BA0 BBWZM BDATZ BGNMA CAG CITATION COF CS3 CSCUP DDRTE DL5 DNIVK DPUIP EBLON EBS EIOEI EJD ESBYG FEDTE FERAY FFXSO FIGPU FINBP FNLPD FRRFC FSGXE FWDCC GGCAI GGRSB GJIRD GNWQR GQ6 GQ7 GQ8 GXS H13 HF~ HG5 HG6 HMJXF HQYDN HRMNR HVGLF HZ~ I09 IHE IJ- IKXTQ ITM IWAJR IXC IZIGR IZQ I~X I~Z J-C J0Z JBSCW JCJTX JZLTJ KDC KOV KOW LAK LLZTM M4Y MA- N2Q N9A NB0 NDZJH NPVJJ NQJWS NU0 O9- O93 O9G O9I O9J OAM OVD P19 P2P P9P PF0 PT4 PT5 QOK QOS R4E R89 R9I RHV RNI RNS ROL RPX RSV RZC RZE RZK S16 S1Z S26 S27 S28 S3B SAP SCLPG SCV SDH SDM SEG SHX SISQX SJYHP SNE SNPRN SNX SOHCF SOJ SPISZ SRMVM SSLCW STPWE SZN T13 T16 TEORI TSG TSK TSV TUC U2A UG4 UOJIU UTJUX UZXMN VC2 VFIZW W23 W48 WK8 YLTOR Z45 Z7R Z7S Z7X Z7Y Z7Z Z83 Z88 Z8M Z8N Z8R Z8S Z8T Z8W Z92 ZMTXR _50 ~EX 7SC 7SP 8FD AAYZH JQ2 L7M L~C L~D |
ID | FETCH-LOGICAL-c228t-934337580abac0c36c9eb57c2ea7faccbd7570d0dbf1ef28cadb60f85d09913c3 |
ISSN | 0925-1030 |
IngestDate | Fri Oct 25 05:47:40 EDT 2024 Thu Sep 12 17:46:48 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 2 |
Language | English |
LinkModel | OpenURL |
MergedId | FETCHMERGED-LOGICAL-c228t-934337580abac0c36c9eb57c2ea7faccbd7570d0dbf1ef28cadb60f85d09913c3 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
PQID | 29077730 |
PQPubID | 23500 |
PageCount | 7 |
ParticipantIDs | proquest_miscellaneous_29077730 crossref_primary_10_1007_s10470_005_2593_y |
PublicationCentury | 2000 |
PublicationDate | 2005-8-00 20050801 |
PublicationDateYYYYMMDD | 2005-08-01 |
PublicationDate_xml | – month: 08 year: 2005 text: 2005-8-00 |
PublicationDecade | 2000 |
PublicationTitle | Analog integrated circuits and signal processing |
PublicationYear | 2005 |
References | C. De Villemagne (2593_CR9) 1987; 46 M. Maute (2593_CR13) 2003 2593_CR6 2593_CR7 2593_CR8 2593_CR3 G. Lorenz (2593_CR4) 1997 R. Neul (2593_CR14) 2000; 2 E. Christen (2593_CR12) 1999; 46 R. Achar (2593_CR5) 2001; 89 2593_CR10 H.R. Schwarz (2593_CR2) 1984 2593_CR11 H.-P. Trah (2593_CR1) 2002; 1 |
References_xml | – volume: 46 start-page: 1263 issue: 10 year: 1999 ident: 2593_CR12 publication-title: IEEE Trans, on CAD-II contributor: fullname: E. Christen – ident: 2593_CR3 – volume-title: Oberflachenmikromechanik-Sensoren als elektrische Teststrukturen zur Charakterisierung ihrer Herstellungsprozesse year: 2003 ident: 2593_CR13 contributor: fullname: M. Maute – volume: 46 start-page: 2141 issue: 6 year: 1987 ident: 2593_CR9 publication-title: Int. J. Control doi: 10.1080/00207178708934040 contributor: fullname: C. De Villemagne – volume: 2 start-page: 67 year: 2000 ident: 2593_CR14 publication-title: Proc. MICRO.tec 2000 contributor: fullname: R. Neul – ident: 2593_CR8 doi: 10.1090/conm/280/04630 – ident: 2593_CR10 – ident: 2593_CR7 doi: 10.1109/DAC.1999.781223 – volume: 1 start-page: 39 issue: 11 year: 2002 ident: 2593_CR1 publication-title: Physik Journal contributor: fullname: H.-P. Trah – start-page: S. 39 volume-title: Integration von mikrosystem-technischen Komponenten in die Netzwerk- und Systemsimulation am Beispiel eines Drehratensensors, 2 year: 1997 ident: 2593_CR4 contributor: fullname: G. Lorenz – volume: 89 start-page: 693 issue: 5 year: 2001 ident: 2593_CR5 publication-title: Proceedings of the IEEE doi: 10.1109/5.929650 contributor: fullname: R. Achar – ident: 2593_CR6 doi: 10.1017/CBO9780511550157.004 – ident: 2593_CR11 doi: 10.1117/12.462833 – volume-title: Methode der finiten Elemente year: 1984 ident: 2593_CR2 doi: 10.1007/978-3-322-96758-9 contributor: fullname: H.R. Schwarz |
SSID | ssj0002740 |
Score | 1.6955826 |
Snippet | Sensor development in the field of microsystem technology is driven by steadily increasing demands on sensor resolution and performance and the need to reduce... |
SourceID | proquest crossref |
SourceType | Aggregation Database |
StartPage | 129 |
Title | System Level Modeling of the Relevant Physical Effects of Inertial Sensors Using Order Reduction Methods |
URI | https://search.proquest.com/docview/29077730 |
Volume | 44 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Jb9NAFB6F9AKHirKIUpY5cCIymvE29rGBVgXRItFW6s2aGY_bSMip0qRS-8_4d7w3i-1QkCgXK7Gcke33Zd7-PULeqVxoxiT8kVRWRino5EgqLSOpudSg4NPSxiEPj_KD0_TLWXY2Gv0cVC2tluqDvv1jX8n_SBXOgVyxS_Yeku0WhRPwGeQLR5AwHP9Jxo5ufPIVC3_sVLMfvoYZrcnv2DkO782Ot7Gi2OtrNz63WE-NTCDgxuK8HVc68A2JOOGXteOUnRza-dJXQwsWWUzm5z3NRD3Rs4VeYf7BxuBn52jfXrr-g6AXMaNjZnZ07OT4uu8--4R5-mm-8INVHNPBALBTab_6MpzO_D_WFy3ycy3WK4xD8CLrSue6KGSMRKg-NWP8HiySiJduxkzYpB1JpAdjPNhxuQ-YOOXNHffJHb3AQp90inN24D7A60uim14JhsT_b7qxq1js2Z1xiQqWqHCJ6uYB2YhhjyvGZGN3fzo96swAcPdtgC88YUipu77N9ftYN4rWbQJr6Jw8JpveQ6G7Dm5bZGTaJ-TRgLfyKblwwKMWeDQAj84bCsCjAXg0AI964OEFAXjUA49a4FELPNoBj3rgPSOn-3snHw8iP7Ij0nFcLKMySZMEXFAmldRMJ7kujcqEjo0UjdRa1SITrGa1arhp4kLLWuWsKbIaPBWe6OQ5Gbfz1rwgNM6UUjleKPK05lxy2G9SpmQjmyIv-TZ5H95ZdemYWaq_SmmbvA1vtYL9E5NisjXz1VUVl0wIUHMv77PcDnnYo_kVGS8XK_MajNOleuNh8AsDQpHV |
link.rule.ids | 315,783,787,27938,27939 |
linkProvider | Library Specific Holdings |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=System+Level+Modeling+of+the+Relevant+Physical+Effects+of+Inertial+Sensors+Using+Order+Reduction+Methods&rft.jtitle=Analog+integrated+circuits+and+signal+processing&rft.au=Reitz%2C+Sven&rft.au=D%C3%B6ring%2C+Christian&rft.au=Bastian%2C+Jens&rft.au=Schneider%2C+Peter&rft.date=2005-08-01&rft.issn=0925-1030&rft.eissn=1573-1979&rft.volume=44&rft.issue=2&rft.spage=129&rft.epage=135&rft_id=info:doi/10.1007%2Fs10470-005-2593-y&rft.externalDBID=n%2Fa&rft.externalDocID=10_1007_s10470_005_2593_y |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0925-1030&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0925-1030&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0925-1030&client=summon |