Stark width and shift for electron number density diagnostics of low temperature plasma: Application to silicon Laser Induced Breakdown Spectroscopy

• Published in: Spectrochimica acta. Part B: Atomic spectroscopy Vol. 131; pp. 79 - 92
• Main Authors: Ivković, M., Konjević, N.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.05.2017
• Subjects: Electron number density; Laser induced plasma spectroscopy; Spectral line shapes and intensities; Spectroscopic plasma diagnostics; Stark broadening; Spectroscopic plasma diagnostics; Stark broadening; Laser induced plasma spectroscopy; Spectral line shapes and intensities; Electron number density

In this work we summarize, analyze and critically evaluate experimental procedures and results of LIBS electron number density plasma characterization using as examples Stark broadened Si I and Si II line profiles. Selected publications are covering the time period from very beginning of silicon LIB...