An IoT model for securing examinations from malpractices

The primary objective of university education is to provide students with the required information and skills to enable them to make a successful contribution to the national development effort. In order to evaluate the level of expertise and skill of students, this preparation includes frequent exa...

Full description

Saved in:
Bibliographic Details
Published inMaterials today : proceedings Vol. 81; pp. 371 - 376
Main Authors Haque, Shameemul, Zeba, Sana, Alimul Haque, Md, Kumar, Kailash, Ali Basha, Mudassir Peeran
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 2023
Subjects
Online AccessGet full text
ISSN2214-7853
2214-7853
DOI10.1016/j.matpr.2021.03.413

Cover

Loading…
More Information
Summary:The primary objective of university education is to provide students with the required information and skills to enable them to make a successful contribution to the national development effort. In order to evaluate the level of expertise and skill of students, this preparation includes frequent examination and appraisal in the form of tests. Manual exams are carried out by most universities; Post Graduate and Under Graduate in India. Due to multiple uses made of the outcomes of the students, these examinations have high stakes. Consequently, the experiments became subject to different types of malpractice. Test malpractice affects the success of students in exams and leaves the scores/grades earned inaccurate, hence a challenge to examination bodies and the nation's education system (India). These are all disturbing signs that pose a danger to the nation. Examination malpractice has eaten deep into the Indian culture of education. Therefore, the object of this paper is to explore the problem of examination malpractice in India. The paper covered relevant measures, procedure setting/implementation and suggestions for this action. And finally, a model is proposed to stop malpractices in the examination. This IoT based model is used for detecting any metallic object or object in a range more than normal IR proximity sensor range. The block diagram of proposed model and circuit diagram for that model discussed in detail. This proposed model may be used for any investigation in the universities examinations.
ISSN:2214-7853
2214-7853
DOI:10.1016/j.matpr.2021.03.413