Jiang, L. (2023). Machine Learning for EMC/SI/PI - Blackbox, Physics Recovery, and Decision Making. IEEE electromagnetic compatibility magazine, 12(4), 65-75. https://doi.org/10.1109/MEMC.2023.10466473
Chicago Style (17th ed.) CitationJiang, Lijun. "Machine Learning for EMC/SI/PI - Blackbox, Physics Recovery, and Decision Making." IEEE Electromagnetic Compatibility Magazine 12, no. 4 (2023): 65-75. https://doi.org/10.1109/MEMC.2023.10466473.
MLA (9th ed.) CitationJiang, Lijun. "Machine Learning for EMC/SI/PI - Blackbox, Physics Recovery, and Decision Making." IEEE Electromagnetic Compatibility Magazine, vol. 12, no. 4, 2023, pp. 65-75, https://doi.org/10.1109/MEMC.2023.10466473.
Warning: These citations may not always be 100% accurate.