Structural characterization and optical properties of UO2 thin films by magnetron sputtering

• Published in: Applied surface science Vol. 256; no. 10; pp. 3047 - 3050
• Main Authors: Chen, Qiuyun, Lai, Xinchun, Bai, Bin, Chu, Mingfu
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier 01.03.2010
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Physics; Atomic force microscopy; AFM; XRD; Film growth; Ellipsometry; Thin films; Magnetrons; Cathode sputtering; Actinides; Uranium; XPS; Uranium dioxide; X-ray photoelectron spectra