Structural characterization and optical properties of UO2 thin films by magnetron sputtering

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Published in	Applied surface science Vol. 256; no. 10; pp. 3047 - 3050
Main Authors	Chen, Qiuyun, Lai, Xinchun, Bai, Bin, Chu, Mingfu
Format	Journal Article
Language	English
Published	Amsterdam Elsevier 01.03.2010
Subjects	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science; rheology Exact sciences and technology Physics Atomic force microscopy AFM XRD Film growth Ellipsometry Thin films Magnetrons Cathode sputtering Actinides Uranium XPS Uranium dioxide X-ray photoelectron spectra
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Author	Lai, Xinchun Chu, Mingfu Bai, Bin Chen, Qiuyun
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Keywords	Atomic force microscopy AFM XRD Film growth Ellipsometry Thin films Magnetrons Cathode sputtering Actinides Uranium XPS Uranium dioxide X-ray photoelectron spectra
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Title	Structural characterization and optical properties of UO2 thin films by magnetron sputtering
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