Structural characterization and optical properties of UO2 thin films by magnetron sputtering

Saved in:
Bibliographic Details
Published inApplied surface science Vol. 256; no. 10; pp. 3047 - 3050
Main Authors Chen, Qiuyun, Lai, Xinchun, Bai, Bin, Chu, Mingfu
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier 01.03.2010
Subjects
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Physics
Atomic force microscopy
AFM
XRD
Film growth
Ellipsometry
Thin films
Magnetrons
Cathode sputtering
Actinides
Uranium
XPS
Uranium dioxide
X-ray photoelectron spectra
Online AccessGet full text

Cover

More Information
ISSN:0169-4332
DOI:10.1016/j.apsusc.2009.11.071