NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories - Ahmed, Soyed Tuhin; Hefenbrock, Michael; Munch, Christopher; Tahoori, Mehdi B. (IEEE transactions on computer-aided design of integrated circuits and systems, 2023)
Keywords: Artificial neural networks; Circuit faults; Computation-in-memory; Faults; Hardware; Inference; Magnetic tunneling; MTJ; Multilayer perceptrons; Neuromorphic; Neuromorphic computing; Nonvolatile memory; Numerical stability; NVM; Resistance; Retention; retention faults; Thermal stability; Washing