APA (7th ed.) Citation

Ahmed, S. T., Hefenbrock, M., Munch, C., & Tahoori, M. B. (2023). NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories. IEEE transactions on computer-aided design of integrated circuits and systems, 42(5), 1. https://doi.org/10.1109/TCAD.2022.3205872

Chicago Style (17th ed.) Citation

Ahmed, Soyed Tuhin, Michael Hefenbrock, Christopher Munch, and Mehdi B. Tahoori. "NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems 42, no. 5 (2023): 1. https://doi.org/10.1109/TCAD.2022.3205872.

MLA (9th ed.) Citation

Ahmed, Soyed Tuhin, et al. "NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, vol. 42, no. 5, 2023, p. 1, https://doi.org/10.1109/TCAD.2022.3205872.