Insight into the Charging and Relaxation Dynamics of Diffusive Memristors in Integration-and-fire Neuron Applications

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Bibliographic Details
Published inJournal of semiconductor technology and science Vol. 22; no. 6; pp. 387 - 394
Main Authors Park, Ju-Hwan, Jeong, Won-Hee, Choi, Byung-Joon
Format Journal Article
LanguageEnglish
Published 대한전자공학회 31.12.2022
Subjects
Diffusive memristor
leaky integration-and-fire (LIF)
parasitic capacitor
threshold switching
relaxation
conducting filament
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ISSN1598-1657
2233-4866
DOI10.5573/JSTS.2022.22.6.387

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ISSN:1598-1657
2233-4866
DOI:10.5573/JSTS.2022.22.6.387