APA (7th ed.) Citation

Kim, K. (2022). Advances in Atomic Force Microscopy for the Electromechanical Characterization of Piezoelectric and Ferroelectric Nanomaterials. Korean Journal of Metals and Materials, 60(9), 629-643. https://doi.org/10.3365/KJMM.2022.60.9.629

Chicago Style (17th ed.) Citation

Kim, Kwanlae. "Advances in Atomic Force Microscopy for the Electromechanical Characterization of Piezoelectric and Ferroelectric Nanomaterials." Korean Journal of Metals and Materials 60, no. 9 (2022): 629-643. https://doi.org/10.3365/KJMM.2022.60.9.629.

MLA (9th ed.) Citation

Kim, Kwanlae. "Advances in Atomic Force Microscopy for the Electromechanical Characterization of Piezoelectric and Ferroelectric Nanomaterials." Korean Journal of Metals and Materials, vol. 60, no. 9, 2022, pp. 629-643, https://doi.org/10.3365/KJMM.2022.60.9.629.