A Surface Encoder Based on Wave Optics

A surface encoder, which is composed of a 2D angle grid and a 2D slope sensor, is analyzed in wave optics. Based on the wave optics model, behavior of optical diffraction pattern on the photo-detector caused by 5-degree-of-freedom motions of the angle grid, which are the X- (Y-) movement, tilt motio...

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Published inJournal of the Japan Society for Precision Engineering, Contributed Papers Vol. 71; no. 8; pp. 1051 - 1055
Main Authors WATANABE, Yoji, GAO, Wei, KIYONO, Satoshi, SHIMIZU, Hiroki
Format Journal Article
LanguageEnglish
Published Tokyo The Japan Society for Precision Engineering 2005
Japan Science and Technology Agency
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ISSN1348-8724
1881-8722
DOI10.2493/jspe.71.1051

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Abstract A surface encoder, which is composed of a 2D angle grid and a 2D slope sensor, is analyzed in wave optics. Based on the wave optics model, behavior of optical diffraction pattern on the photo-detector caused by 5-degree-of-freedom motions of the angle grid, which are the X- (Y-) movement, tilt motion about the X- (Y-) axis and rotation about the Z-axis, are investigated. The diffraction pattern on the photo-detector show different behavior in each of the motions. In addition, a new 5 degree-of-freedom measurement method is proposed based on the analysis results. This method uses a multi-cell photodiode instead of the QPD in the slope sensor. The principle of the new surface encoder and the design of the multi-cell photodiode are described. Simulation results based on the wave optics model are also presented.
AbstractList A surface encoder, which is composed of a 2D angle grid and a 2D slope sensor, is analyzed in wave optics. Based on the wave optics model, behavior of optical diffraction pattern on the photo-detector caused by 5-degree-of-freedom motions of the angle grid, which are the X- (Y-) movement, tilt motion about the X- (Y-) axis and rotation about the Z-axis, are investigated. The diffraction pattern on the photo-detector show different behavior in each of the motions. In addition, a new 5 degree-of-freedom measurement method is proposed based on the analysis results. This method uses a multi-cell photodiode instead of the QPD in the slope sensor. The principle of the new surface encoder and the design of the multi-cell photodiode are described. Simulation results based on the wave optics model are also presented.
Author WATANABE, Yoji
GAO, Wei
KIYONO, Satoshi
SHIMIZU, Hiroki
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Cites_doi 10.1016/j.precisioneng.2003.12.003
10.1016/0141-6359(82)90106-4
10.1016/S0007-8506(07)62950-3
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Snippet A surface encoder, which is composed of a 2D angle grid and a 2D slope sensor, is analyzed in wave optics. Based on the wave optics model, behavior of optical...
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SubjectTerms measurement
multi-cell photodiode
optical simulation
surface encoder
Title A Surface Encoder Based on Wave Optics
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