Reliability analysis of competing failure systems considering multiple-damage self-recovery and aggravation evolution mechanisms

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Published inQuality technology & quantitative management pp. 1 - 24
Main Authors Li, Yan, Yu, Xiangwen, Gao, Hongda
Format Journal Article
LanguageEnglish
Published 07.04.2025
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Author Gao, Hongda
Li, Yan
Yu, Xiangwen
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Cites_doi 10.1239/jap/996986754
10.1016/j.ress.2017.05.004
10.1007/s10958-006-0306-4
10.1080/16843703.2023.2187011
10.1080/16843703.2024.2448643
10.1002/qre.3525
10.1016/j.apm.2020.09.047
10.1016/j.cie.2018.03.002
10.1080/16843703.2016.1264146
10.1177/1748006X221138996
10.1016/j.ress.2021.107925
10.1080/16843703.2021.1963089
10.1002/qre.1805
10.1109/TR.2007.895306
10.1016/j.ress.2019.106601
10.1080/16843703.2021.2021616
10.1016/j.ress.2020.107260
10.1016/j.apm.2020.08.032
10.1016/j.ress.2017.11.006
10.1016/j.ress.2023.109844
10.1016/j.ress.2024.110272
10.1016/j.ress.2023.109671
10.1016/j.ress.2017.12.003
10.1016/j.cie.2020.106359
10.1016/j.ress.2022.108876
10.1080/16843703.2019.1696010
10.1080/0740817X.2014.955152
10.1080/16843703.2022.2124644
10.1080/16843703.2022.2146904
10.1002/qre.3006
10.1002/qre.3316
10.1080/0740817X.2010.491502
10.1016/j.ress.2022.108951
10.1002/qre.3235
10.1117/12.476345
10.1016/j.ress.2020.107166
10.1016/j.ress.2023.109526
10.1080/0740817X.2013.812270
10.2307/1427554
10.1016/j.ress.2018.12.011
10.1023/A:1009959004020
10.1080/16843703.2023.2202955
10.1016/j.ress.2023.109537
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